Time Expansion Chamber

TEC online homepage
TEC gas system homepage
TEC Shift Lists 2000:

Minutes of TEC meetings

Preparation of High Energy data taking:timescale to get SMD alignment, TEC calibration and B tagging as defined at the meeting of 27/4/97




Average signal amplitude throughout the years.


No sign of aging!!!


Inner Chamber                            Outer Chamber

TEC Calibration: :L3 note describing the performance of the central tracker from 1997 to 2000 and the improvements in the calibration method.


2000 TEC chamber status

"le plot du jour" :Status of the drift velocity in the gas test chamber on a day-by-day basis. The big jump in the drift velocity affects runs between 869300 (20/7/2000) and 889600 (11/8/2000).

Time markers:

TEC and SMD performances plots:

gas test chamber:Status of the drift velocity in the gas test chamber for 1999.

Time markers:

TEC and SMD performances plots:

plots are made taking out half sectors with reduced HV in sectors 3, 4 , 20, 21
  • TEC dca resolution for Z: Impact parameter distribution for tracks using TEC chamber hits only.
  • TEC dca resolution for HE: Impact parameter distribution for tracks using TEC chamber hits only for High Energy data.
  • TEC Pt resolution for Z as measured from the distribution of the difference of the inverse of the transverse momentum measured in TEC and in the Muon chambers.
  • TEC Pt resolution for HE for High energy data as measured from the distribution of the difference of the inverse of the transverse momentum measured in TEC and in the Muon chambers.
  • TEC+SMD dca resolution for Z: Impact parameter distribution for tracks using TEC chamber hits only.
  • TEC+SMD dca resolution for HE: Impact parameter distribution for tracks using TEC chamber hits only for High Energy data.
  • TEC+SMD Pt resolution for Z as measured from the distribution of the difference of the inverse of the transverse momentum measured in TEC and in the Muon chambers.
  • TEC+SMD Pt resolution for HE for High energy data as measured from the distribution of the difference of the inverse of the transverse momentum measured in TEC and in the Muon chambers.
      •  
      1998 TEC chamber status

gas test chamber:Status of the drift velocity in the gas test chamber for 1998.

TEC and SMD performances plots:
  • TEC dca resolution: Impact parameter distribution for tracks using TEC chamber hits only.
  • TEC+SMD dca resolution for Z: Impact parameter distribution for tracks with TEC and SMD hits.
  • TEC+SMD dca resolution for HE: Impact parameter distribution for tracks with TEC and SMD hits.
  • TEC Pt resolution as measured from the distribution of the difference of the inverse of the transverse momentum measured in TEC and in the Muon chambers.
  • TEC+SMD Pt resolution for Z as measured from the distribution of the difference of the inverse of the transverse momentum measured in TEC+SMD and in the Muon chambers.
  • TEC+SMD Pt resolution for HE as measured from the distribution of the difference of the inverse of the transverse momentum measured in TEC+SMD and in the Muon chambers.
      •  
      1997 TEC chamber status

gas test chamber:Status of the drift velocity in the gas test chamber for 1997.

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