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\begin{document}
 

\begin{tabular}{l c c c c }
\hline
Source & $\quad x_-\quad$ & $\quad y_-\quad$ & $\quad x_+\quad$ & $\quad y_+\quad$ \\
\hline 
Statistical                                    & 1.7 & 2.2    & 1.9 & 1.9   \\
\hline
Strong phase measurements                      & 0.4 & 1.1    & 0.4 & 0.9   \\
\hline
Efficiency corrections                         & 0.6 & 0.2    & 0.6 & 0.1   \\
Mass fit PDFs                                  & 0.2 & 0.3    & 0.2 & 0.3    \\
Different mis-ID shape over Dalitz plot         & 0.2 & 0.1    & 0.1 & 0.1   \\
Different low mass shape over Dalitz plot      & 0.1 & 0.2    & 0.1 & 0.1   \\
Uncertainty on $ B\xspace\xspace^0_ s\xspace\xspace\xspace\rightarrow\xspace\kern 0.2em\overline{\kern -0.2em  D\xspace}{}\xspace{}^0\xspace\pi\xspace\xspace^+\xspace K\xspace\xspace^-\xspace$ yield     & 0.1 & 0.1    & 0.1 & 0.1   \\
Bias correction                                & 0.1 & 0.1    & 0.1 & 0.1   \\
Bin migration                                      & 0.1 & 0.1    & 0.1 & 0.1   \\
$K^0$  $ C\!P$ \xspace violation and material interaction             & 0.1 & 0.2    & 0.1 & 0.1   \\
\hline
Total experimental systematic uncertainty                      & 0.7 & 0.5    & 0.7 & 0.4    \\
\hline
\end{tabular}
\end{document}
