A measurement of charm mixing and $CP$-violating parameters is reported, using $\bar{B} \rightarrow D^0 ( \rightarrow K_S^0 \pi^+ \pi^-) \mu^- \bar{\nu}_\mu X$ decays reconstructed in proton-proton collisions collected by the LHCb experiment during the years 2016 to 2018, corresponding to an integrated luminosity of 5.4 fb$^{-1}$. The measured mixing and $CP$-violating parameters are $$x_{\rm CP} = [ 4.29 \pm 1.48 (stat) \pm 0.26 (syst) ] \times 10^{-3} ,$$ $$y_{\rm CP} = [ 12.61 \pm 3.12 (stat) \pm 0.83 (syst) ] \times 10^{-3} ,$$ $$\Delta x = [ -0.77 \pm 0.93 (stat) \pm 0.28 (syst) ] \times 10^{-3} ,$$ $$\Delta y = [ 3.01 \pm 1.92 (stat) \pm 0.26 (syst) ] \times 10^{-3} .$$ The results are complementary to and consistent with previous measurements. A combination with the recent LHCb analysis of $D^{*+} \rightarrow D^0 ( \rightarrow K_S^0 \pi^+ \pi^-) \pi^+ $ decays is reported.
(Left) $ D ^0$ Dalitz plot of reconstructed $\overline{ B } \rightarrow D ^0 (\rightarrow K ^0_{\mathrm{S}} \pi ^+ \pi ^- )\mu ^- \bar{\nu}_\mu X$ decays for the $ D ^0$ flavor and (right) definition of the binning scheme proposed by CLEO [25]. |
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$ K ^0_{\mathrm{S}}$ $\pi ^+$ $\pi ^-$ invariant-mass distribution of (left) DD and (right) LL $ K ^0_{\mathrm{S}}$ candidates after all selection requirements, with fit results superimposed. |
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Relative efficiency as a function of $ D ^0$ decay-time and $ m^2(\pi ^+ \pi ^- )$ as determined from $\overline{ B } \rightarrow D ^0 (\rightarrow K ^0_{\mathrm{S}} \pi ^+ \pi ^- )\mu ^- \bar{\nu}_\mu X$ candidates, separately for (left) DD and (right) LL $ K ^0_{\mathrm{S}} $ candidates. The distributions are smoothed using bilinear interpolation. |
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(Top) $ C P$ -averaged yield ratios and (bottom) difference of $ D ^0$ and $\overline{ D } {}^0$ yield ratios as a function of $ D ^0$ decay-time for the different Dalitz bins. The solid blue line shows the nominal fit projections and the dashed red line shows the fit projections when $ x_{ C P }$ is fixed to zero. |
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Two-dimensional 68% and 95% confidence-level contours on (left) ($x$, $y$) and (right) ($|q/p| - 1$, $\phi$). Results from Run 2 ${ D ^{*+} \rightarrow D ^0 (\rightarrow K ^0_{\mathrm{S}} \pi ^+ \pi ^- )\pi ^+ }$ (Prompt) [9], ${\overline{ B } \rightarrow D ^0 (\rightarrow K ^0_{\mathrm{S}} \pi ^+ \pi ^- )\mu ^- \bar{\nu}_\mu X }$ (SL), and their combination are shown. |
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Animated gif made out of all figures. |
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Summary of the uncertainties on the measured quantities. The total systematic uncertainty is the sum in quadrature of the individual components. The uncertainties due to the strong-phase inputs are (by default) included in the statistical uncertainty. Here, to ease comparison with other sources, we also report the separate contributions due to the strong phase inputs and to the statistics of the data sample. |
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Fit results of $ x_{ C P }$ , $ y_{ C P }$ , $\Delta x$ , and $\Delta y$ in $\overline{ B } \rightarrow D ^0 (\rightarrow K ^0_{\mathrm{S}} \pi ^+ \pi ^- )\mu ^- \bar{\nu}_\mu X$ sample. The first contribution to the uncertainty is statistical, the second systematic. Statistical and systematic correlations between $ x_{ C P }$ , $ y_{ C P }$ , $\Delta x$ , and $\Delta y$ are provided. |
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Fit results of $ x_{ C P }$ , $ y_{ C P }$ , $\Delta x$ , and $\Delta y$ in the combination. The first contribution to the uncertainty is statistical, the second systematic. Statistical and systematic correlations between $ x_{ C P }$ , $ y_{ C P }$ , $\Delta x$ , and $\Delta y$ are provided. |
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Correlation between $ x_{ C P }$ , $ y_{ C P }$ , $\Delta x$ , and $\Delta y$ for each sytematic uncertainty in the ${\overline{ B } \rightarrow D ^0 (\rightarrow K ^0_{\mathrm{S}} \pi ^+ \pi ^- )\mu ^- \bar{\nu}_\mu X }$ sample. |
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Correlation between $ x_{ C P }$ , $ y_{ C P }$ , $\Delta x$ , and $\Delta y$ for each systematic uncertainty in the combination. |
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The statistical uncertainty on $ x_{ C P }$ , $ y_{ C P }$ , $\Delta x$ and $\Delta y$ , and the component of the statistical uncertainty due to the limited precision of the external measurements of the strong phases for the semileptonic sample. |
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The component of the statistical uncertainty due to the limited precision of the external measurements of the strong phases for the combined measurement of the prompt and semileptonic samples. |
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Created on 20 April 2024.