• Calibration single event (Col. B)
• Calibration burst [until memory full] (Col. C)
• High Energy Test Beam single event (Col. D)
• High Energy Test Beam burst [until memory full] (Col. E)
• Demo mode (ILC like beam) [now same as TB burst]

The Maximum readout time is calculated (and minimal achievable frequency in continuous operation mode).
The critical acquisition line is bolded in red

Three sets of parameters are available

• Hardware (more of less fixed)
  • ASICs memory & event size
  • Number of ASIC per partition
  • Number of partition per DIF
  • Number of concentration lines in LDA & DCC
• DAQ (Clock speeds)
• Physics (Occupancy for one high energy TB event) & Noise

• DataFlux_II.ods: Data Flux Table (OOo)
• DataFlux_II.xls: Data Flux Table (xls)
• DataFlux_II.pdf: Data Flux (pdf)

-- VincentBoudry - 07-Apr-2010