CMS logoCMS event Hgg
Compact Muon Solenoid
LHC, CERN

CMS-PAS-B2G-15-006
Search for top quark partners with charge 5/3 at $\sqrt{s}= $ 13 TeV
Abstract: A search for the production of heavy partners of the top quark with charge 5/3 is presented. The data sample corresponds to an integrated luminosity of 2.2 fb$^{-1}$ and was collected at a center of mass energy of $\sqrt{s} =$ 13 TeV by the CMS experiment at the Large Hadron Collider. The search is performed using events with two different signatures: same-sign dileptons as well as a semi-leptonic final state. No significant excess is observed in the data above the expected standard model background. Upper bounds at the 95\% confidence level are set on the production cross section of heavy top quark partners.
Figures

png ;
Figure 1-a:
Feynman diagrams for the production of pairs of $X_{5/3}$ particles via QCD processes.

png ;
Figure 1-b:
Feynman diagrams for the production of pairs of $X_{5/3}$ particles via QCD processes.

png ; pdf ;
Figure 2-a:
The $H^{\text {lep}}_{\text {T}}$ distributions after the same-sign selection and Z-quarkonia lepton invariant mass veto and requiring at least two AK4 jets in the event. The bottom histogram on all plots shows the difference between the observed and the predicted number of events in that bin divided by the total uncertainty (i.e. combined systematic and statistical).

png ; pdf ;
Figure 2-b:
The $H^{\text {lep}}_{\text {T}}$ distributions after the same-sign selection and Z-quarkonia lepton invariant mass veto and requiring at least two AK4 jets in the event. The bottom histogram on all plots shows the difference between the observed and the predicted number of events in that bin divided by the total uncertainty (i.e. combined systematic and statistical).

png ; pdf ;
Figure 2-c:
The $H^{\text {lep}}_{\text {T}}$ distributions after the same-sign selection and Z-quarkonia lepton invariant mass veto and requiring at least two AK4 jets in the event. The bottom histogram on all plots shows the difference between the observed and the predicted number of events in that bin divided by the total uncertainty (i.e. combined systematic and statistical).

png ; pdf ;
Figure 2-d:
The $H^{\text {lep}}_{\text {T}}$ distributions after the same-sign selection and Z-quarkonia lepton invariant mass veto and requiring at least two AK4 jets in the event. The bottom histogram on all plots shows the difference between the observed and the predicted number of events in that bin divided by the total uncertainty (i.e. combined systematic and statistical).

png ; pdf ;
Figure 3-a:
95% CL expected and observed limits for a left-handed (a) and right-handed (b) $X_{5/3}$ for all channels combined.

png ; pdf ;
Figure 3-b:
95% CL expected and observed limits for a left-handed (a) and right-handed (b) $X_{5/3}$ for all channels combined.

png ; pdf ;
Figure 4-a:
Distributions of lepton $ {p_{\mathrm {T}}} $ (a), $ {E_{\mathrm {T}}^{\text {miss}}} $ (b), number of jets (c), ${p_{\mathrm {T}}} $ of all jets (d), number of b tagged jets (e), the number of W tagged jets (f) in data and MC for combined electron and muon event samples, at the preselection level. Uncertainties include statistical and all systematic uncertainties.

png ; pdf ;
Figure 4-b:
Distributions of lepton $ {p_{\mathrm {T}}} $ (a), $ {E_{\mathrm {T}}^{\text {miss}}} $ (b), number of jets (c), ${p_{\mathrm {T}}} $ of all jets (d), number of b tagged jets (e), the number of W tagged jets (f) in data and MC for combined electron and muon event samples, at the preselection level. Uncertainties include statistical and all systematic uncertainties.

png ; pdf ;
Figure 4-c:
Distributions of lepton $ {p_{\mathrm {T}}} $ (a), $ {E_{\mathrm {T}}^{\text {miss}}} $ (b), number of jets (c), ${p_{\mathrm {T}}} $ of all jets (d), number of b tagged jets (e), the number of W tagged jets (f) in data and MC for combined electron and muon event samples, at the preselection level. Uncertainties include statistical and all systematic uncertainties.

png ; pdf ;
Figure 4-d:
Distributions of lepton $ {p_{\mathrm {T}}} $ (a), $ {E_{\mathrm {T}}^{\text {miss}}} $ (b), number of jets (c), ${p_{\mathrm {T}}} $ of all jets (d), number of b tagged jets (e), the number of W tagged jets (f) in data and MC for combined electron and muon event samples, at the preselection level. Uncertainties include statistical and all systematic uncertainties.

png ; pdf ;
Figure 4-e:
Distributions of lepton $ {p_{\mathrm {T}}} $ (a), $ {E_{\mathrm {T}}^{\text {miss}}} $ (b), number of jets (c), ${p_{\mathrm {T}}} $ of all jets (d), number of b tagged jets (e), the number of W tagged jets (f) in data and MC for combined electron and muon event samples, at the preselection level. Uncertainties include statistical and all systematic uncertainties.

png ; pdf ;
Figure 4-f:
Distributions of lepton $ {p_{\mathrm {T}}} $ (a), $ {E_{\mathrm {T}}^{\text {miss}}} $ (b), number of jets (c), ${p_{\mathrm {T}}} $ of all jets (d), number of b tagged jets (e), the number of W tagged jets (f) in data and MC for combined electron and muon event samples, at the preselection level. Uncertainties include statistical and all systematic uncertainties.

png ; pdf ;
Figure 5-a:
Distributions of min[M($\ell $, b)] (a) and $\Delta $R($\ell $, sub-leading jet) (b) in data and MC for selected events with at least four jets and lepton $ {p_{\mathrm {T}}} >$ 80 GeV. Uncertainties include statistical and all systematic uncertainties.

png ; pdf ;
Figure 5-b:
Distributions of min[M($\ell $, b)] (a) and $\Delta $R($\ell $, sub-leading jet) (b) in data and MC for selected events with at least four jets and lepton $ {p_{\mathrm {T}}} >$ 80 GeV. Uncertainties include statistical and all systematic uncertainties.

png ; pdf ;
Figure 6-a:
Distributions of min[M($\ell $, b)] in (a,b) 0 or (c,d) 1+ boosted W tagged jets and (a,c) 1 or (b,d) 2+ b tagged jets categories for combined electron and muon samples, at the final selection level. Uncertainties include statistical and all systematic uncertainties. For each category, the QCD contribution is not displayed if it is less than 0.5% of the total background.

png ; pdf ;
Figure 6-b:
Distributions of min[M($\ell $, b)] in (a,b) 0 or (c,d) 1+ boosted W tagged jets and (a,c) 1 or (b,d) 2+ b tagged jets categories for combined electron and muon samples, at the final selection level. Uncertainties include statistical and all systematic uncertainties. For each category, the QCD contribution is not displayed if it is less than 0.5% of the total background.

png ; pdf ;
Figure 6-c:
Distributions of min[M($\ell $, b)] in (a,b) 0 or (c,d) 1+ boosted W tagged jets and (a,c) 1 or (b,d) 2+ b tagged jets categories for combined electron and muon samples, at the final selection level. Uncertainties include statistical and all systematic uncertainties. For each category, the QCD contribution is not displayed if it is less than 0.5% of the total background.

png ; pdf ;
Figure 6-d:
Distributions of min[M($\ell $, b)] in (a,b) 0 or (c,d) 1+ boosted W tagged jets and (a,c) 1 or (b,d) 2+ b tagged jets categories for combined electron and muon samples, at the final selection level. Uncertainties include statistical and all systematic uncertainties. For each category, the QCD contribution is not displayed if it is less than 0.5% of the total background.

png ; pdf ;
Figure 7-a:
Distributions of min[M($\ell $, b)] in the $ \mathrm{ t \bar{t} } $ control region, for one b tagged jet (a) and 2+ b tagged jets (b) categories, and of min[M($\ell $, b)] in the V + jets control region, for zero W tagged (c) and 1+ W tagged jet (d) categories for combined electron and muon event samples. Uncertainties include statistical and all systematic uncertainties except those which are derived from the control regions. For each category, the QCD contribution is not displayed if it is less than 0.5% of the total background.

png ; pdf ;
Figure 7-b:
Distributions of min[M($\ell $, b)] in the $ \mathrm{ t \bar{t} } $ control region, for one b tagged jet (a) and 2+ b tagged jets (b) categories, and of min[M($\ell $, b)] in the V + jets control region, for zero W tagged (c) and 1+ W tagged jet (d) categories for combined electron and muon event samples. Uncertainties include statistical and all systematic uncertainties except those which are derived from the control regions. For each category, the QCD contribution is not displayed if it is less than 0.5% of the total background.

png ; pdf ;
Figure 7-c:
Distributions of min[M($\ell $, b)] in the $ \mathrm{ t \bar{t} } $ control region, for one b tagged jet (a) and 2+ b tagged jets (b) categories, and of min[M($\ell $, b)] in the V + jets control region, for zero W tagged (c) and 1+ W tagged jet (d) categories for combined electron and muon event samples. Uncertainties include statistical and all systematic uncertainties except those which are derived from the control regions. For each category, the QCD contribution is not displayed if it is less than 0.5% of the total background.

png ; pdf ;
Figure 7-d:
Distributions of min[M($\ell $, b)] in the $ \mathrm{ t \bar{t} } $ control region, for one b tagged jet (a) and 2+ b tagged jets (b) categories, and of min[M($\ell $, b)] in the V + jets control region, for zero W tagged (c) and 1+ W tagged jet (d) categories for combined electron and muon event samples. Uncertainties include statistical and all systematic uncertainties except those which are derived from the control regions. For each category, the QCD contribution is not displayed if it is less than 0.5% of the total background.

png ; pdf ;
Figure 8-a:
95% CL expected and observed upper limits (Bayesian) after combining electron/muon, 0/1+ W tagged jets, and 1/2+ b tagged jets channels for an integrated luminosity of 2.2 fb$^{-1}$ for left handed (a) and right handed (b) $X_{5/3}$ signals.

png ; pdf ;
Figure 8-b:
95% CL expected and observed upper limits (Bayesian) after combining electron/muon, 0/1+ W tagged jets, and 1/2+ b tagged jets channels for an integrated luminosity of 2.2 fb$^{-1}$ for left handed (a) and right handed (b) $X_{5/3}$ signals.

png ; pdf ;
Figure 9-a:
95% CL expected and observed upper limits (Bayesian) after combining the same-sign dileptons, and the lepton+jets signatures for an integrated luminosity of 2.2 fb$^{-1}$ for left handed (a) and right handed (b) $X_{5/3}$ signals.

png ; pdf ;
Figure 9-b:
95% CL expected and observed upper limits (Bayesian) after combining the same-sign dileptons, and the lepton+jets signatures for an integrated luminosity of 2.2 fb$^{-1}$ for left handed (a) and right handed (b) $X_{5/3}$ signals.
Compact Muon Solenoid
LHC, CERN