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| CMS-PAS-SUS-17-012 | ||
| Search for supersymmetry using events with a photon, a lepton, and missing transverse momentum in pp collisions at $\sqrt{s} = $ 13 TeV | ||
| CMS Collaboration | ||
| July 2018 | ||
| Abstract: Results of a search for supersymmetry are presented using events with a photon, an electron or muon, and large missing transverse momentum. The analysis is based on a data sample corresponding to an integrated luminosity of 35.9 fb$^{-1}$ of proton-proton collisions at $\sqrt{s} = $ 13 TeV, produced by the CERN LHC and collected with the CMS detector in 2016. Models of supersymmetry with gauge-mediated supersymmetry breaking yield events with photons in the final state as well as electroweak gauge bosons decaying to leptons. Searches for events with both a photon and a lepton are sensitive probes of these models. No excess of events is observed beyond expectations from standard model processes. The results of the search are interpreted in the context of simplified models inspired by gauge-mediated supersymmetry breaking. These models are used to derive upper limits on the production cross sections of supersymmetric processes and set bounds on masses of supersymmetric particles. | ||
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Links:
CDS record (PDF) ;
CADI line (restricted) ;
These preliminary results are superseded in this paper, JHEP 01 (2019) 154. The superseded preliminary plots can be found here. |
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| Figures | |
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Figure 1:
Feynman diagrams showing the production and decay modes of the signal models T5Wg (left), T6Wg (center), and TChiWg (right) considered in this analysis. |
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Figure 1-a:
Feynman diagrams showing the production and decay modes of the signal models T5Wg (left), T6Wg (center), and TChiWg (right) considered in this analysis. |
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Figure 1-b:
Feynman diagrams showing the production and decay modes of the signal models T5Wg (left), T6Wg (center), and TChiWg (right) considered in this analysis. |
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Figure 1-c:
Feynman diagrams showing the production and decay modes of the signal models T5Wg (left), T6Wg (center), and TChiWg (right) considered in this analysis. |
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Figure 2:
Verification of the e-to-$ {\gamma}$ misidentification estimation method using simulated data. The predicted ${{p_{\mathrm {T}}} ^\text {miss}}$ distribution for events with misidentified photons in the e$\gamma$ (left) and $\mu {\gamma}$ (right) channel from direct simulation (points) and from using the proxy sample estimation method from data (histograms). The vertical bars on the points show the statistical uncertainty in the simulation, while the horizontal bars give the bin widths. The lower panels show the ratio of the predictions from direct simulation to those from the proxy sample method. The vertical bars on the points show again the statistical uncertainty, and the hatched areas give the quadrature sum of the statistical and systematic uncertainties in the simulated background. |
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Figure 2-a:
Verification of the e-to-$ {\gamma}$ misidentification estimation method using simulated data. The predicted ${{p_{\mathrm {T}}} ^\text {miss}}$ distribution for events with misidentified photons in the e$\gamma$ (left) and $\mu {\gamma}$ (right) channel from direct simulation (points) and from using the proxy sample estimation method from data (histograms). The vertical bars on the points show the statistical uncertainty in the simulation, while the horizontal bars give the bin widths. The lower panels show the ratio of the predictions from direct simulation to those from the proxy sample method. The vertical bars on the points show again the statistical uncertainty, and the hatched areas give the quadrature sum of the statistical and systematic uncertainties in the simulated background. |
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Figure 2-b:
Verification of the e-to-$ {\gamma}$ misidentification estimation method using simulated data. The predicted ${{p_{\mathrm {T}}} ^\text {miss}}$ distribution for events with misidentified photons in the e$\gamma$ (left) and $\mu {\gamma}$ (right) channel from direct simulation (points) and from using the proxy sample estimation method from data (histograms). The vertical bars on the points show the statistical uncertainty in the simulation, while the horizontal bars give the bin widths. The lower panels show the ratio of the predictions from direct simulation to those from the proxy sample method. The vertical bars on the points show again the statistical uncertainty, and the hatched areas give the quadrature sum of the statistical and systematic uncertainties in the simulated background. |
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Figure 3:
The post-fit $\Delta \phi (\ell, {{p_{\mathrm {T}}} ^\text {miss}})$ distributions for the $V {\gamma}$ (dashed-green) and misidentified-lepton (solid-red) backgrounds. The black points show the data in the 40 $ < {{p_{\mathrm {T}}} ^\text {miss}} < $ 70 GeV control region with the fit result overlaid for the e$\gamma$ (left) and $\mu {\gamma} $ (right) channels, while the grey-blue distribution gives the fit result and the hatched area indicates the fit uncertainty. The vertical bars on the points represent the statistical uncertainty. The lower panels show the ratio of the fit result to the data. The vertical bars on the points show the statistical uncertainty in the data, and the hatched areas give the fit uncertainty. |
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Figure 3-a:
The post-fit $\Delta \phi (\ell, {{p_{\mathrm {T}}} ^\text {miss}})$ distributions for the $V {\gamma}$ (dashed-green) and misidentified-lepton (solid-red) backgrounds. The black points show the data in the 40 $ < {{p_{\mathrm {T}}} ^\text {miss}} < $ 70 GeV control region with the fit result overlaid for the e$\gamma$ (left) and $\mu {\gamma} $ (right) channels, while the grey-blue distribution gives the fit result and the hatched area indicates the fit uncertainty. The vertical bars on the points represent the statistical uncertainty. The lower panels show the ratio of the fit result to the data. The vertical bars on the points show the statistical uncertainty in the data, and the hatched areas give the fit uncertainty. |
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Figure 3-b:
The post-fit $\Delta \phi (\ell, {{p_{\mathrm {T}}} ^\text {miss}})$ distributions for the $V {\gamma}$ (dashed-green) and misidentified-lepton (solid-red) backgrounds. The black points show the data in the 40 $ < {{p_{\mathrm {T}}} ^\text {miss}} < $ 70 GeV control region with the fit result overlaid for the e$\gamma$ (left) and $\mu {\gamma} $ (right) channels, while the grey-blue distribution gives the fit result and the hatched area indicates the fit uncertainty. The vertical bars on the points represent the statistical uncertainty. The lower panels show the ratio of the fit result to the data. The vertical bars on the points show the statistical uncertainty in the data, and the hatched areas give the fit uncertainty. |
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Figure 4:
Distributions of ${{p_{\mathrm {T}}} ^\text {miss}}$ (a, b), $ {p_{\mathrm {T}}} ^{{\gamma}}$ (c, d), and $ {H_{\mathrm {T}}}$ (e, f) from data (points) and simulated SM predictions (stacked histograms) for the e$\gamma$ (left) and $\mu {\gamma} $ (right) channels. Simulated signal distributions from from the TChiWg model (dotted) with $M_{\tilde{\chi}^0 / \tilde{\chi}^\pm} = $ 800 GeV and the T5Wg model (solid) with $M_{{\tilde{g}}} = $ 1700 GeV are overlaid. The ${{p_{\mathrm {T}}} ^\text {miss}}$ distribution includes all events with $ {M_{\mathrm {T}}} > $ 100 GeV, while the $ {p_{\mathrm {T}}} ^{{\gamma}}$ and $ {H_{\mathrm {T}}}$ distributions only include events with $ {M_{\mathrm {T}}} > $ 100 GeV and $ {{p_{\mathrm {T}}} ^\text {miss}} > $ 120 GeV. The vertical bars on the points give the statistical uncertainty in the data. The horizontal bars show the bin widths. The lower panels display the ratio of the data to the total background prediction. The vertical bars on the points show the statistical uncertainty in the data, and the hatched areas give the quadrature sum of the statistical and systematic uncertainties in the simulated background. |
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Figure 4-a:
Distributions of ${{p_{\mathrm {T}}} ^\text {miss}}$ (a, b), $ {p_{\mathrm {T}}} ^{{\gamma}}$ (c, d), and $ {H_{\mathrm {T}}}$ (e, f) from data (points) and simulated SM predictions (stacked histograms) for the e$\gamma$ (left) and $\mu {\gamma} $ (right) channels. Simulated signal distributions from from the TChiWg model (dotted) with $M_{\tilde{\chi}^0 / \tilde{\chi}^\pm} = $ 800 GeV and the T5Wg model (solid) with $M_{{\tilde{g}}} = $ 1700 GeV are overlaid. The ${{p_{\mathrm {T}}} ^\text {miss}}$ distribution includes all events with $ {M_{\mathrm {T}}} > $ 100 GeV, while the $ {p_{\mathrm {T}}} ^{{\gamma}}$ and $ {H_{\mathrm {T}}}$ distributions only include events with $ {M_{\mathrm {T}}} > $ 100 GeV and $ {{p_{\mathrm {T}}} ^\text {miss}} > $ 120 GeV. The vertical bars on the points give the statistical uncertainty in the data. The horizontal bars show the bin widths. The lower panels display the ratio of the data to the total background prediction. The vertical bars on the points show the statistical uncertainty in the data, and the hatched areas give the quadrature sum of the statistical and systematic uncertainties in the simulated background. |
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Figure 4-b:
Distributions of ${{p_{\mathrm {T}}} ^\text {miss}}$ (a, b), $ {p_{\mathrm {T}}} ^{{\gamma}}$ (c, d), and $ {H_{\mathrm {T}}}$ (e, f) from data (points) and simulated SM predictions (stacked histograms) for the e$\gamma$ (left) and $\mu {\gamma} $ (right) channels. Simulated signal distributions from from the TChiWg model (dotted) with $M_{\tilde{\chi}^0 / \tilde{\chi}^\pm} = $ 800 GeV and the T5Wg model (solid) with $M_{{\tilde{g}}} = $ 1700 GeV are overlaid. The ${{p_{\mathrm {T}}} ^\text {miss}}$ distribution includes all events with $ {M_{\mathrm {T}}} > $ 100 GeV, while the $ {p_{\mathrm {T}}} ^{{\gamma}}$ and $ {H_{\mathrm {T}}}$ distributions only include events with $ {M_{\mathrm {T}}} > $ 100 GeV and $ {{p_{\mathrm {T}}} ^\text {miss}} > $ 120 GeV. The vertical bars on the points give the statistical uncertainty in the data. The horizontal bars show the bin widths. The lower panels display the ratio of the data to the total background prediction. The vertical bars on the points show the statistical uncertainty in the data, and the hatched areas give the quadrature sum of the statistical and systematic uncertainties in the simulated background. |
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Figure 4-c:
Distributions of ${{p_{\mathrm {T}}} ^\text {miss}}$ (a, b), $ {p_{\mathrm {T}}} ^{{\gamma}}$ (c, d), and $ {H_{\mathrm {T}}}$ (e, f) from data (points) and simulated SM predictions (stacked histograms) for the e$\gamma$ (left) and $\mu {\gamma} $ (right) channels. Simulated signal distributions from from the TChiWg model (dotted) with $M_{\tilde{\chi}^0 / \tilde{\chi}^\pm} = $ 800 GeV and the T5Wg model (solid) with $M_{{\tilde{g}}} = $ 1700 GeV are overlaid. The ${{p_{\mathrm {T}}} ^\text {miss}}$ distribution includes all events with $ {M_{\mathrm {T}}} > $ 100 GeV, while the $ {p_{\mathrm {T}}} ^{{\gamma}}$ and $ {H_{\mathrm {T}}}$ distributions only include events with $ {M_{\mathrm {T}}} > $ 100 GeV and $ {{p_{\mathrm {T}}} ^\text {miss}} > $ 120 GeV. The vertical bars on the points give the statistical uncertainty in the data. The horizontal bars show the bin widths. The lower panels display the ratio of the data to the total background prediction. The vertical bars on the points show the statistical uncertainty in the data, and the hatched areas give the quadrature sum of the statistical and systematic uncertainties in the simulated background. |
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Figure 4-d:
Distributions of ${{p_{\mathrm {T}}} ^\text {miss}}$ (a, b), $ {p_{\mathrm {T}}} ^{{\gamma}}$ (c, d), and $ {H_{\mathrm {T}}}$ (e, f) from data (points) and simulated SM predictions (stacked histograms) for the e$\gamma$ (left) and $\mu {\gamma} $ (right) channels. Simulated signal distributions from from the TChiWg model (dotted) with $M_{\tilde{\chi}^0 / \tilde{\chi}^\pm} = $ 800 GeV and the T5Wg model (solid) with $M_{{\tilde{g}}} = $ 1700 GeV are overlaid. The ${{p_{\mathrm {T}}} ^\text {miss}}$ distribution includes all events with $ {M_{\mathrm {T}}} > $ 100 GeV, while the $ {p_{\mathrm {T}}} ^{{\gamma}}$ and $ {H_{\mathrm {T}}}$ distributions only include events with $ {M_{\mathrm {T}}} > $ 100 GeV and $ {{p_{\mathrm {T}}} ^\text {miss}} > $ 120 GeV. The vertical bars on the points give the statistical uncertainty in the data. The horizontal bars show the bin widths. The lower panels display the ratio of the data to the total background prediction. The vertical bars on the points show the statistical uncertainty in the data, and the hatched areas give the quadrature sum of the statistical and systematic uncertainties in the simulated background. |
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Figure 4-e:
Distributions of ${{p_{\mathrm {T}}} ^\text {miss}}$ (a, b), $ {p_{\mathrm {T}}} ^{{\gamma}}$ (c, d), and $ {H_{\mathrm {T}}}$ (e, f) from data (points) and simulated SM predictions (stacked histograms) for the e$\gamma$ (left) and $\mu {\gamma} $ (right) channels. Simulated signal distributions from from the TChiWg model (dotted) with $M_{\tilde{\chi}^0 / \tilde{\chi}^\pm} = $ 800 GeV and the T5Wg model (solid) with $M_{{\tilde{g}}} = $ 1700 GeV are overlaid. The ${{p_{\mathrm {T}}} ^\text {miss}}$ distribution includes all events with $ {M_{\mathrm {T}}} > $ 100 GeV, while the $ {p_{\mathrm {T}}} ^{{\gamma}}$ and $ {H_{\mathrm {T}}}$ distributions only include events with $ {M_{\mathrm {T}}} > $ 100 GeV and $ {{p_{\mathrm {T}}} ^\text {miss}} > $ 120 GeV. The vertical bars on the points give the statistical uncertainty in the data. The horizontal bars show the bin widths. The lower panels display the ratio of the data to the total background prediction. The vertical bars on the points show the statistical uncertainty in the data, and the hatched areas give the quadrature sum of the statistical and systematic uncertainties in the simulated background. |
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Figure 4-f:
Distributions of ${{p_{\mathrm {T}}} ^\text {miss}}$ (a, b), $ {p_{\mathrm {T}}} ^{{\gamma}}$ (c, d), and $ {H_{\mathrm {T}}}$ (e, f) from data (points) and simulated SM predictions (stacked histograms) for the e$\gamma$ (left) and $\mu {\gamma} $ (right) channels. Simulated signal distributions from from the TChiWg model (dotted) with $M_{\tilde{\chi}^0 / \tilde{\chi}^\pm} = $ 800 GeV and the T5Wg model (solid) with $M_{{\tilde{g}}} = $ 1700 GeV are overlaid. The ${{p_{\mathrm {T}}} ^\text {miss}}$ distribution includes all events with $ {M_{\mathrm {T}}} > $ 100 GeV, while the $ {p_{\mathrm {T}}} ^{{\gamma}}$ and $ {H_{\mathrm {T}}}$ distributions only include events with $ {M_{\mathrm {T}}} > $ 100 GeV and $ {{p_{\mathrm {T}}} ^\text {miss}} > $ 120 GeV. The vertical bars on the points give the statistical uncertainty in the data. The horizontal bars show the bin widths. The lower panels display the ratio of the data to the total background prediction. The vertical bars on the points show the statistical uncertainty in the data, and the hatched areas give the quadrature sum of the statistical and systematic uncertainties in the simulated background. |
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Figure 5:
The number of signal events from data (points) and from simulated background (stacked histograms) for the 18 search bins in ${{p_{\mathrm {T}}} ^\text {miss}}$, ${H_{\mathrm {T}}}$, and $ {p_{\mathrm {T}}} ^{{\gamma}}$ in the $\mu + {\gamma}$ channel (left) and the $e+ {\gamma}$ channel (right). For each ${{p_{\mathrm {T}}} ^\text {miss}}$ range, the first, second, and last bins correspond to the $ {H_{\mathrm {T}}}$ ranges [0,100], [100,400] and $ > $ 400 GeV, respectively. The lower panel displays the ratio of the data to the background predictions. The vertical bars on the points show the statistical uncertainty in the data, and the hatched areas give the quadrature sum of the statistical and systematic uncertainties in the simulated background. |
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Figure 6:
The observed and expected 95% CL upper limits on the production cross sections for the TChiWg simplified model, together with the theoretical cross sections. The inner (darker) band and outer (lighter) band around the expected upper limits indicate the regions containing 68 and 95%, respectively, of the distribution of limits expected under the background-only hypothesis. The band around the theoretical cross section gives the $ \pm $1 standard deviation uncertainty in the cross section. |
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Figure 7:
The observed and expected 95% CL exclusion contours for $M_{{\tilde{g}}}/ {\mathrm {\tilde{q}}}$ versus $M_{\tilde{\chi}}$ (regions to the left of the curves are excluded) and the 95% CL upper limits on the pair production cross sections for the (a) T5Wg and (b) T6Wg simplified models. The upper limits on the cross section assume a 50% branching fraction for $\tilde{g}(\tilde{q})\rightarrow \tilde{\chi}^0/\tilde{\chi}^\pm \mathrm{q\bar{q}}$. The bands around the observed and expected exclusion contours indicate the $ \pm $1 standard deviation range when including the experimental and theoretical uncertainties, respectively. |
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Figure 7-a:
The observed and expected 95% CL exclusion contours for $M_{{\tilde{g}}}/ {\mathrm {\tilde{q}}}$ versus $M_{\tilde{\chi}}$ (regions to the left of the curves are excluded) and the 95% CL upper limits on the pair production cross sections for the (a) T5Wg and (b) T6Wg simplified models. The upper limits on the cross section assume a 50% branching fraction for $\tilde{g}(\tilde{q})\rightarrow \tilde{\chi}^0/\tilde{\chi}^\pm \mathrm{q\bar{q}}$. The bands around the observed and expected exclusion contours indicate the $ \pm $1 standard deviation range when including the experimental and theoretical uncertainties, respectively. |
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Figure 7-b:
The observed and expected 95% CL exclusion contours for $M_{{\tilde{g}}}/ {\mathrm {\tilde{q}}}$ versus $M_{\tilde{\chi}}$ (regions to the left of the curves are excluded) and the 95% CL upper limits on the pair production cross sections for the (a) T5Wg and (b) T6Wg simplified models. The upper limits on the cross section assume a 50% branching fraction for $\tilde{g}(\tilde{q})\rightarrow \tilde{\chi}^0/\tilde{\chi}^\pm \mathrm{q\bar{q}}$. The bands around the observed and expected exclusion contours indicate the $ \pm $1 standard deviation range when including the experimental and theoretical uncertainties, respectively. |
| Tables | |
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Table 1:
Summary of the systematic uncertainties affecting the SUSY signals and SM background estimates given in percent. |
| Summary |
| A search for supersymmetry with general gauge mediation in events with a photon, an electron or muon, and large missing transverse momentum is presented. This analysis is based on a sample of proton-proton collisions at $\sqrt{s} = $ 13 TeV corresponding to an integrated luminosity of 35.9 fb$^{-1}$ recorded by the CMS experiment in 2016. The data are examined in bins of the photon transverse energy, the magnitude of the missing transverse momentum, and $ {H_{\mathrm{T}}} $, the scalar sum of jet energies. The standard model background is evaluated primarily using control samples in the data, with simulation used to evaluate backgrounds from electroweak processes. The data is found to agree with the standard model expectation, without significant excess in the search region. The results of the search are interpreted as a 95% confidence level upper limits on the production cross section of supersymmetry particles in the context of simplified models motivated by gauge-mediated supersymmetry breaking. The TChiWg simplified model, based on direct electroweak production of a neutralino and chargino, is excluded for next-to-lightest supersymmetric particle masses below 900 GeV. For strong production models, such as the T5Wg simplified model of gluino pair production and the T6Wg model of squark pair production, this search excludes gluinos (squarks) with masses of up to 1700 (1400) GeV in the T5Wg (T6Wg) scenarios. |
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