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CMS-PAS-HIG-16-036
A search for doubly-charged Higgs boson production in three and four lepton final states at $\sqrt{s}= $ 13 TeV
Abstract: A search for a doubly-charged Higgs boson, $\Phi^{\pm\pm}$, in proton-proton collisions at $\sqrt{s} = $ 13 TeV with the CMS experiment at the LHC using a data sample corresponding to an integrated luminosity of 12.9 fb$^{-1}$ is presented. The search considers final states with three lepton final states coming from the associated production of $\Phi^{\pm\pm}\Phi^{\mp}$ and the four lepton final states coming from the pair production of $\Phi^{++}\Phi^{-}$. Lower bounds on the doubly-charged Higgs boson mass are reported for a variety of assumptions on its branching ratio to charged lepton pairs.
Figures & Tables Summary References CMS Publications
Figures

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Figure 1:
Feynman diagrams for the four (a) and three (b) lepton final states

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Figure 1-a:
Feynman diagram for the four lepton final states

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Figure 1-b:
Feynman diagram for the three lepton final states

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Figure 2:
Same sign dilepton mass distributions for each three lepton final state category. The solid symbols represent the data with Poisson statistical uncertainties, while the filled histograms represent the background expectation from simulation or data as described in the text. The shaded bands represent the statistical uncertainty in the background estimation. A sample signal distribution for the associated production mode with $ {m_{ {\Phi ^{\pm \pm }} }} = $ 500 GeV is overlaid. Only samples with nonzero expectation are shown. The ratio of the observed (Obs) and expected (Exp) distributions is also included.

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Figure 2-a:
Same sign dilepton mass distribution for the $\ell^{\pm}\ell^{\pm}\ell^{\mp}$ three lepton final state category. The solid symbols represent the data with Poisson statistical uncertainties, while the filled histograms represent the background expectation from simulation or data as described in the text. The shaded bands represent the statistical uncertainty in the background estimation. A sample signal distribution for the associated production mode with $ {m_{ {\Phi ^{\pm \pm }} }} = $ 500 GeV is overlaid. Only samples with nonzero expectation are shown. The ratio of the observed (Obs) and expected (Exp) distributions is also included.

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Figure 2-b:
Same sign dilepton mass distribution for the $\ell^{\pm}\ell^{\pm}\tau^{\mp}$ three lepton final state category. The solid symbols represent the data with Poisson statistical uncertainties, while the filled histograms represent the background expectation from simulation or data as described in the text. The shaded bands represent the statistical uncertainty in the background estimation. A sample signal distribution for the associated production mode with $ {m_{ {\Phi ^{\pm \pm }} }} = $ 500 GeV is overlaid. Only samples with nonzero expectation are shown. The ratio of the observed (Obs) and expected (Exp) distributions is also included.

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Figure 2-c:
Same sign dilepton mass distribution for the $\ell^{\pm}\tau^{\pm}\ell^{\mp}$ three lepton final state category. The solid symbols represent the data with Poisson statistical uncertainties, while the filled histograms represent the background expectation from simulation or data as described in the text. The shaded bands represent the statistical uncertainty in the background estimation. A sample signal distribution for the associated production mode with $ {m_{ {\Phi ^{\pm \pm }} }} = $ 500 GeV is overlaid. Only samples with nonzero expectation are shown. The ratio of the observed (Obs) and expected (Exp) distributions is also included.

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Figure 2-d:
Same sign dilepton mass distribution for the $\ell^{\pm}\tau^{\pm}\tau^{\mp}$ three lepton final state category. The solid symbols represent the data with Poisson statistical uncertainties, while the filled histograms represent the background expectation from simulation or data as described in the text. The shaded bands represent the statistical uncertainty in the background estimation. A sample signal distribution for the associated production mode with $ {m_{ {\Phi ^{\pm \pm }} }} = $ 500 GeV is overlaid. Only samples with nonzero expectation are shown. The ratio of the observed (Obs) and expected (Exp) distributions is also included.

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Figure 2-e:
Same sign dilepton mass distribution for the $\tau^{\pm}\tau^{\pm}\ell^{\mp}$ three lepton final state category. The solid symbols represent the data with Poisson statistical uncertainties, while the filled histograms represent the background expectation from simulation or data as described in the text. The shaded bands represent the statistical uncertainty in the background estimation. A sample signal distribution for the associated production mode with $ {m_{ {\Phi ^{\pm \pm }} }} = $ 500 GeV is overlaid. Only samples with nonzero expectation are shown. The ratio of the observed (Obs) and expected (Exp) distributions is also included.

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Figure 2-f:
Same sign dilepton mass distribution for the $\tau^{\pm}\tau^{\pm}\tau^{\mp}$ three lepton final state category. The solid symbols represent the data with Poisson statistical uncertainties, while the filled histograms represent the background expectation from simulation or data as described in the text. The shaded bands represent the statistical uncertainty in the background estimation. A sample signal distribution for the associated production mode with $ {m_{ {\Phi ^{\pm \pm }} }} = $ 500 GeV is overlaid. Only samples with nonzero expectation are shown. The ratio of the observed (Obs) and expected (Exp) distributions is also included.

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Figure 3:
Same sign dilepton mass distributions for each four lepton final state category. The solid symbols represent the data with Poisson statistical uncertainties, while the histograms represent the background expectation from simulation or data as described in the text. The shaded bands represent the statistical uncertainty in the background estimation. A sample signal distribution for the pair production mode with $ {m_{ {\Phi ^{\pm \pm }} }} = $ 500 GeV is overlaid. Only samples with nonzero expectation are shown. The ratio of the observed (Obs) and expected (Exp) distributions is also included.

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Figure 3-a:
Same sign dilepton mass distribution for the $\ell^{+}\ell^{+}\ell^{-}\ell^{-}$ four lepton final state category. The solid symbols represent the data with Poisson statistical uncertainties, while the histograms represent the background expectation from simulation or data as described in the text. The shaded bands represent the statistical uncertainty in the background estimation. A sample signal distribution for the pair production mode with $ {m_{ {\Phi ^{\pm \pm }} }} = $ 500 GeV is overlaid. Only samples with nonzero expectation are shown. The ratio of the observed (Obs) and expected (Exp) distributions is also included.

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Figure 3-b:
Same sign dilepton mass distribution for the $\ell^{\pm}\ell^{\pm}\ell^{\mp}\tau^{\mp}$ four lepton final state category. The solid symbols represent the data with Poisson statistical uncertainties, while the histograms represent the background expectation from simulation or data as described in the text. The shaded bands represent the statistical uncertainty in the background estimation. A sample signal distribution for the pair production mode with $ {m_{ {\Phi ^{\pm \pm }} }} = $ 500 GeV is overlaid. Only samples with nonzero expectation are shown. The ratio of the observed (Obs) and expected (Exp) distributions is also included.

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Figure 3-c:
Same sign dilepton mass distribution for the $\ell^{\pm}\ell^{\pm}\tau^{\mp}\tau^{\mp}$ four lepton final state category. The solid symbols represent the data with Poisson statistical uncertainties, while the histograms represent the background expectation from simulation or data as described in the text. The shaded bands represent the statistical uncertainty in the background estimation. A sample signal distribution for the pair production mode with $ {m_{ {\Phi ^{\pm \pm }} }} = $ 500 GeV is overlaid. Only samples with nonzero expectation are shown. The ratio of the observed (Obs) and expected (Exp) distributions is also included.

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Figure 3-d:
Same sign dilepton mass distribution for the $\ell^{+}\tau^{+}\ell^{-}\tau^{-}$ four lepton final state category. The solid symbols represent the data with Poisson statistical uncertainties, while the histograms represent the background expectation from simulation or data as described in the text. The shaded bands represent the statistical uncertainty in the background estimation. A sample signal distribution for the pair production mode with $ {m_{ {\Phi ^{\pm \pm }} }} = $ 500 GeV is overlaid. Only samples with nonzero expectation are shown. The ratio of the observed (Obs) and expected (Exp) distributions is also included.

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Figure 3-e:
Same sign dilepton mass distribution for the $\ell^{\pm}\tau^{\pm}\tau^{\mp}\tau^{\mp}$ four lepton final state category. The solid symbols represent the data with Poisson statistical uncertainties, while the histograms represent the background expectation from simulation or data as described in the text. The shaded bands represent the statistical uncertainty in the background estimation. A sample signal distribution for the pair production mode with $ {m_{ {\Phi ^{\pm \pm }} }} = $ 500 GeV is overlaid. Only samples with nonzero expectation are shown. The ratio of the observed (Obs) and expected (Exp) distributions is also included.

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Figure 3-f:
Same sign dilepton mass distribution for the $\tau^{+}\tau^{+}\tau^{-}\tau^{-}$ four lepton final state category. The solid symbols represent the data with Poisson statistical uncertainties, while the histograms represent the background expectation from simulation or data as described in the text. The shaded bands represent the statistical uncertainty in the background estimation. A sample signal distribution for the pair production mode with $ {m_{ {\Phi ^{\pm \pm }} }} = $ 500 GeV is overlaid. Only samples with nonzero expectation are shown. The ratio of the observed (Obs) and expected (Exp) distributions is also included.

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Figure 4:
Limits on associated and pair production for each 100% branching fraction to $\mathrm{ e } \mathrm{ e } $ and $\mathrm{ e } \mu $, as well as the combined limit.

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Figure 4-a:
Limits on associated and pair production for 100% branching fraction to $\mathrm{ e } \mathrm{ e } $ .

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Figure 4-b:
Combined limit for 100% branching fraction to $\mathrm{ e } \mathrm{ e } $.

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Figure 4-c:
Limits on associated and pair production for 100% branching fraction to $\mathrm{ e } \mu $.

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Figure 4-d:
Combined limit for 100% branching fraction to $\mathrm{ e } \mu $.

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Figure 5:
Limits on associated and pair production for each 100% branching fraction to $\mu \mu $ and $\mathrm{ e } \tau $, as well as the combined limit.

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Figure 5-a:
Limits on associated and pair production for 100% branching fraction to $\mu \mu $.

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Figure 5-b:
Combined limit for 100% branching fraction to $\mu \mu $.

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Figure 5-c:
Limits on associated and pair production for 100% branching fraction to $\mathrm{ e } \tau $.

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Figure 5-d:
Combined limit for 100% branching fraction to $\mathrm{ e } \tau $.

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Figure 6:
Limits on associated and pair production for each 100% branching fraction to $\mu \tau $ and $\tau \tau $, as well as the combined limit.

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Figure 6-a:
Limits on associated and pair production for each 100% branching fraction to $\mu \tau $.

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Figure 6-b:
Combined limit for each 100% branching fraction to $\mu \tau $.

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Figure 6-c:
Limits on associated and pair production for each 100% branching fraction to $\tau \tau $.

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Figure 6-d:
Combined limit for each 100% branching fraction to $\tau \tau $.

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Figure 7:
Limits on associated and pair production for Benchmark 1 and Benchmark 2, as well as the combined limit.

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Figure 7-a:
Limits on associated and pair production for Benchmark 1.

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Figure 7-b:
Combined limit for Benchmark 1.

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Figure 7-c:
Limits on associated and pair production for Benchmark 2.

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Figure 7-d:
Combined limit for Benchmark 2.

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Figure 8:
Limits on associated and pair production for Benchmark 3 and Benchmark 4, as well as the combined limit.

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Figure 8-a:
Limits on associated and pair production for Benchmark 3.

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Figure 8-b:
Combined limit for Benchmark 3.

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Figure 8-c:
Limits on associated and pair production for Benchmark 4.

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Figure 8-d:
Combined limit for Benchmark 4.

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Figure 9:
Summary of expected and observed limits for each production mode and the combined limit. The shaded region represents the excluded mass points and the thick solid line represents the expected exclusion with the hashed region indicating the direction.
Tables

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Table 1:
Branching fraction scenarios for the decays of $\Phi ^{\pm \pm }$.

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Table 2:
Selections made on three lepton final states to define the final signal region.

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Table 3:
Selections made on four lepton final states to define the final signal region.

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Table 4:
The effect of each uncertainty in the signal region expected value. These uncertainties vary for each final state and mass hypothesis.

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Table 5:
Yields for the signal region for a mass hypothesis of 500 GeV. The uncertainties shown are combined statistical and systematic.

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Table 6:
Observed (expected) 95% CL limits for associated (AP) and pair production (PP) and the combined limit.
Summary
A search for a doubly-charged Higgs boson utilizing $ \sqrt{s} = $ 13 TeV LHC proton-proton collisions is presented. The data correspond to an integrated luminosity of 12.9 fb$^{-1}$ collected by the CMS experiment. No significant excess over standard model background expectations is observed, and lower bounds on the $\Phi^{\pm\pm}$ mass are extended to between 800 GeV and 820 GeV for final states with 100% decays to $\mathrm{ ee }$, $\mathrm{ e }\mu$, and $\mu\mu$, and to 714 GeV and 643 GeV for final states with 100% decays to $e\tau$ and $\mu\tau$, respectively. Final states with 100% decays to $\tau\tau$ are excluded up to 535 GeV. In addition, benchmark points of the type II see-saw model targeting four possible neutrino mass hypotheses are also probed, with lower bounds between 716 GeV and 761 GeV.
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Compact Muon Solenoid
LHC, CERN