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| CMS-TOP-16-006 ; CERN-EP-2016-321 | ||
| Measurement of the $\mathrm{ t \bar{t} }$ production cross section using events with one lepton and at least one jet in pp collisions at $\sqrt{s}= $ 13 TeV | ||
| CMS Collaboration | ||
| 22 January 2017 | ||
| JHEP 09 (2017) 051 | ||
| Abstract: A measurement of the $\mathrm{ t \bar{t} }$ production cross section at $\sqrt{s}=$ 13 TeV is presented using proton-proton collisions, corresponding to an integrated luminosity of 2.2 fb$^{-1}$, collected with the CMS detector at the LHC. Final states with one isolated charged lepton (electron or muon) and at least one jet are selected and categorized according to the accompanying jet multiplicity. From a likelihood fit to the invariant mass distribution of the isolated lepton and a jet identified as coming from the hadronization of a bottom quark, the cross section is measured to be $\sigma(\mathrm{ t \bar{t} })=$ 888 $\pm$ 2 (stat) $^{+26}_{-28}$ (syst) $\pm$ 20 (lumi) pb, in agreement with the standard model prediction. Using the expected dependence of the cross section on the pole mass of the top quark ($m_{\mathrm{ t }}$), the value of $m_{\mathrm{ t }}$ is found to be 170.6 $\pm$ 2.7 GeV. | ||
| Links: e-print arXiv:1701.06228 [hep-ex] (PDF) ; CDS record ; inSPIRE record ; CADI line (restricted) ; | ||
| Figures & Tables | Summary | Additional Figures | References | CMS Publications |
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| Figures | |
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Figure 1:
Event yields from data and the expected $ {\mathrm{ t } \mathrm{ \bar{t} } } $ signal and backgrounds for each of the 11 independent categories. Distributions are combined for the two lepton charges and flavors. The bins represent the measured number of jets ({j}) and b-tagged jets ({b}). The bottom panel shows the ratio between the data and the expectations. The relative uncertainty owing to the statistical uncertainty in the simulations and the systematic uncertainty in the total integrated luminosity is represented as a shaded band. |
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Figure 2:
Distributions in the observables used to fit the data with the contributions from all leptons and charges combined. Panels on the left show the distributions in $M(\ell ,\mathrm{ b } )$, and on the right in $\mathrm{min}\, M(\ell ,\mathrm{ b } )$, for events with one and two b-tagged jets, respectively. From top to bottom, the events correspond to those with 1, 2, 3, or at least 4 jets. The lower plot in each panel shows the ratio between the data and expectations. The relative uncertainty owing to the statistical uncertainty in the simulations and the systematic uncertainty in the total integrated luminosity is represented as a shaded band. |
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Figure 2-a:
Distributions in $M(\ell ,\mathrm{ b } )$ for events with one b-tagged jet for events with 1 jet, with the contributions from all leptons and charges combined. The lower plot shows the ratio between the data and expectations. The relative uncertainty owing to the statistical uncertainty in the simulations and the systematic uncertainty in the total integrated luminosity is represented as a shaded band. |
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Figure 2-b:
Distributions in $M(\ell ,\mathrm{ b } )$ for events with one b-tagged jet, for events with 2 jets, with the contributions from all leptons and charges combined. The lower plot shows the ratio between the data and expectations. The relative uncertainty owing to the statistical uncertainty in the simulations and the systematic uncertainty in the total integrated luminosity is represented as a shaded band. |
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Figure 2-c:
Distributions in $\mathrm{min}\, M(\ell ,\mathrm{ b } )$ for events with two b-tagged jets, for events with 2 jets, with the contributions from all leptons and charges combined. The lower plot shows the ratio between the data and expectations. The relative uncertainty owing to the statistical uncertainty in the simulations and the systematic uncertainty in the total integrated luminosity is represented as a shaded band. |
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Figure 2-d:
Distributions in $M(\ell ,\mathrm{ b } )$ for events with one b-tagged jet, for events with 3 jets, with the contributions from all leptons and charges combined. The lower plot shows the ratio between the data and expectations. The relative uncertainty owing to the statistical uncertainty in the simulations and the systematic uncertainty in the total integrated luminosity is represented as a shaded band. |
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Figure 2-e:
Distributions in $\mathrm{min}\, M(\ell ,\mathrm{ b } )$ for events with two b-tagged jets, for events with 3 jets, with the contributions from all leptons and charges combined. The lower plot shows the ratio between the data and expectations. The relative uncertainty owing to the statistical uncertainty in the simulations and the systematic uncertainty in the total integrated luminosity is represented as a shaded band. |
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Figure 2-f:
Distributions in $M(\ell ,\mathrm{ b } )$ for events with one b-tagged jet, for events with at least 4 jets, with the contributions from all leptons and charges combined. The lower plot shows the ratio between the data and expectations. The relative uncertainty owing to the statistical uncertainty in the simulations and the systematic uncertainty in the total integrated luminosity is represented as a shaded band. |
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Figure 2-g:
Distributions in $\mathrm{min}\, M(\ell ,\mathrm{ b } )$ for events with two b-tagged jets, for events with at least 4 jets, with the contributions from all leptons and charges combined. The lower plot shows the ratio between the data and expectations. The relative uncertainty owing to the statistical uncertainty in the simulations and the systematic uncertainty in the total integrated luminosity is represented as a shaded band. |
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Figure 3:
(left) The observed (solid curve) and expected (dashed curve) variation of the likelihood as a function of the signal strength $\mu $ for the distribution-based analysis. The expected curve is obtained by performing the fit using simulated events with $m_\mathrm{ t } =$ 172.5 GeV. For comparison, the corresponding curves for the counting cross-check analysis are also shown. The two horizontal lines represent the values in the PLR that are used to determine the 68% and 95% confidence level (CL) intervals for the signal strength. (right) Comparison of the values of the signal strength extracted for different combinations of events for the distribution-based default analysis (solid circles) and the cross-check counting analysis (open circles). The horizontal bars represent the total uncertainties, except the beam energy uncertainty. The shaded bands represent the uncertainty in the final combined signal strength obtained from the distribution-based and cross-check analyses. |
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Figure 3-a:
The observed (solid curve) and expected (dashed curve) variation of the likelihood as a function of the signal strength $\mu $ for the distribution-based analysis. The expected curve is obtained by performing the fit using simulated events with $m_\mathrm{ t } =$ 172.5 GeV. For comparison, the corresponding curves for the counting cross-check analysis are also shown. The two horizontal lines represent the values in the PLR that are used to determine the 68% and 95% confidence level (CL) intervals for the signal strength. |
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Figure 3-b:
Comparison of the values of the signal strength extracted for different combinations of events for the distribution-based default analysis (solid circles) and the cross-check counting analysis (open circles). The horizontal bars represent the total uncertainties, except the beam energy uncertainty. The shaded bands represent the uncertainty in the final combined signal strength obtained from the distribution-based and cross-check analyses. |
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Figure 4:
Estimated change $\Delta \mu $ in the measured signal strength $\mu $, coming from the listed experimental and theoretical sources of uncertainties in the main analysis. The open bars represent the values of the observed impact relative to the fitted signal strength. The values are compared to the expectations (shaded bars) by performing the fit using simulated events with $m_\mathrm{ t } = $ 172.5 GeV. The various contributions are shown from the largest to the smallest observed impact. |
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Figure 5:
Dependence of the likelihood on the top quark pole mass (solid curve). The expected dependence from the simulation, using the a priori set of nuisance parameters with their expected values at $m_\mathrm{ t } =$ 172.5 GeV, is shown for comparison as the dotted curve. The changes in the likelihood corresponding to the 68% and 95% confidence levels (CL) are shown by the dashed lines. |
| Tables | |
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Table 1:
The source and value of the systematic uncertainties in the measurement of $m_\mathrm{ t } $. |
| Summary |
| A measurement of the $\mathrm{ t \bar{t} }$ production cross section at $\sqrt{s} =$ 13 TeV has been presented by CMS in final states containing one isolated lepton and at least one jet. The acceptance in the fiducial part of the phase space is estimated with an uncertainty of 1.6% and has a negligible dependence on $m_\mathrm{ t }$. By performing a simultaneous fit to event distributions in 44 independent categories, we measure the strength of the $\mathrm{ t \bar{t} }$ signal relative to the NNLO+NNLL computation [45] with an uncertainty of 3.9%. We obtain an inclusive $\mathrm{ t \bar{t} }$ production cross section $\sigma(\mathrm{ t \bar{t} })=$ 888 $\pm$ 2 (stat) $_{-26}^{+28}$ (syst) $\pm$ 20 (lumi) pb, which is compatible with the standard model prediction. In addition, the top quark pole mass, $m_\mathrm{ t }$, is extracted at NNLO using the same data and the CT14 PDF set and found to be $m_\mathrm{ t }=$ 170.6 $\pm$ 2.7 GeV. This value is in good agreement with measurements using other techniques. |
| Additional Figures | |
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Additional Figure 1:
Summary of the impacts on $\delta \mu $ and pulls of the most significant nuisance parameters used in the count analysis (left) and in the analysis of distributions (right), when the fit is performed to the Asimov dataset for $m_\mathrm{ t } = $ 172.5 GeV is considered. In each plot the left panel shows the post-fit pull (value and uncertainty) of each nuisance, while the right panel displays the estimated impact on the fit for the signal strength. Only the first thirty nuisances are displayed, being their name shown at each row of the plots. |
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Additional Figure 1-a:
Summary of the impacts on $\delta \mu $ and pulls of the most significant nuisance parameters used in the count analysis, when the fit is performed to the Asimov dataset for $m_\mathrm{ t } = $ 172.5 GeV is considered. The left panel shows the post-fit pull (value and uncertainty) of each nuisance, while the right panel displays the estimated impact on the fit for the signal strength. Only the first thirty nuisances are displayed, being their name shown at each row of the plot. |
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Additional Figure 1-b:
Summary of the impacts on $\delta \mu $ and pulls of the most significant nuisance parameters used in the analysis of distributions, when the fit is performed to the Asimov dataset for $m_\mathrm{ t } = $ 172.5 GeV is considered. The left panel shows the post-fit pull (value and uncertainty) of each nuisance, while the right panel displays the estimated impact on the fit for the signal strength. Only the first thirty nuisances are displayed, being their name shown at each row of the plot. |
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Additional Figure 2:
Summary of the impacts on $\delta \mu $ and pulls of the most significant nuisance parameters used in the count analysis (left) and in the analysis of distributions (right), when the fit is performed to the data. In each plot the left panel shows the post-fit pull (value and uncertainty) of each nuisance, while the right panel displays the estimated impact on the fit for the signal strength. Only the first thirty nuisances are displayed, being their name shown at each row of the plots. |
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Additional Figure 2-a:
Summary of the impacts on $\delta \mu $ and pulls of the most significant nuisance parameters used in the count analysis, when the fit is performed to the data. The left panel shows the post-fit pull (value and uncertainty) of each nuisance, while the right panel displays the estimated impact on the fit for the signal strength. Only the first thirty nuisances are displayed, being their name shown at each row of the plot. |
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Additional Figure 2-b:
Summary of the impacts on $\delta \mu $ and pulls of the most significant nuisance parameters used in the analysis of distributions, when the fit is performed to the data. The left panel shows the post-fit pull (value and uncertainty) of each nuisance, while the right panel displays the estimated impact on the fit for the signal strength. Only the first thirty nuisances are displayed, being their name shown at each row of the plot. |
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Additional Figure 3:
Correlation matrix after the fit is performed to the data for the nuisance parameters with most significant impact on the signal strength. The matrix obtained for the count analysis is shown on the left, while the one obtained for the analysis of distributions is shown on the right. |
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Additional Figure 3-a:
Correlation matrix after the fit is performed to the data for the nuisance parameters with most significant impact on the signal strength, as obtained for the count analysis. |
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Additional Figure 3-b:
Correlation matrix after the fit is performed to the data for the nuisance parameters with most significant impact on the signal strength, as obtained for the analysis of distributions. |
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Additional Figure 4:
Comparison of the post-fit distributions with the data for electron events with no b-tagged jet. Negatively (positively) charged electrons are shown on the top (bottom) row. From left to right events with one, two, three or at least four jets are shown. The top panels show the stacked distributions of signal and background processes and the observed data. A shaded band represents the post-fit uncertainty. The middle panels show the ratio of the post-fit to pre-fit distributions for the signal and background sum. The bottom panel shows the data to signal plus background expectations, prior and after the fit. The error bar in the points is the statistics in data. A shaded band represents the relative postfit and prefit uncertainties. |
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Additional Figure 4-a:
Comparison of the post-fit distributions with the data for electron events with no b-tagged jet. Events with a negatively charged electron and one jet are shown. The top panel shows the stacked distributions of signal and background processes and the observed data. A shaded band represents the post-fit uncertainty. The middle panel shows the ratio of the post-fit to pre-fit distributions for the signal and background sum. The bottom panel shows the data to signal plus background expectations, prior and after the fit. The error bar in the points is the statistics in data. A shaded band represents the relative postfit and prefit uncertainties. |
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Additional Figure 4-b:
Comparison of the post-fit distributions with the data for electron events with no b-tagged jet. Events with a negatively charged electron and two jets are shown. The top panel shows the stacked distributions of signal and background processes and the observed data. A shaded band represents the post-fit uncertainty. The middle panel shows the ratio of the post-fit to pre-fit distributions for the signal and background sum. The bottom panel shows the data to signal plus background expectations, prior and after the fit. The error bar in the points is the statistics in data. A shaded band represents the relative postfit and prefit uncertainties. |
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Additional Figure 4-c:
Comparison of the post-fit distributions with the data for electron events with no b-tagged jet. Events with a negatively charged electron and three jets are shown. The top panel shows the stacked distributions of signal and background processes and the observed data. A shaded band represents the post-fit uncertainty. The middle panel shows the ratio of the post-fit to pre-fit distributions for the signal and background sum. The bottom panel shows the data to signal plus background expectations, prior and after the fit. The error bar in the points is the statistics in data. A shaded band represents the relative postfit and prefit uncertainties. |
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Additional Figure 4-d:
Comparison of the post-fit distributions with the data for electron events with no b-tagged jet. Events with a negatively charged electron and at least four jets are shown. The top panel shows the stacked distributions of signal and background processes and the observed data. A shaded band represents the post-fit uncertainty. The middle panel shows the ratio of the post-fit to pre-fit distributions for the signal and background sum. The bottom panel shows the data to signal plus background expectations, prior and after the fit. The error bar in the points is the statistics in data. A shaded band represents the relative postfit and prefit uncertainties. |
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Additional Figure 4-e:
Comparison of the post-fit distributions with the data for electron events with no b-tagged jet. Positively charged electrons for events with one jet are shown. The top panel shows the stacked distributions of signal and background processes and the observed data. A shaded band represents the post-fit uncertainty. The middle panel shows the ratio of the post-fit to pre-fit distributions for the signal and background sum. The bottom panel shows the data to signal plus background expectations, prior and after the fit. The error bar in the points is the statistics in data. A shaded band represents the relative postfit and prefit uncertainties. |
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Additional Figure 4-f:
Comparison of the post-fit distributions with the data for electron events with no b-tagged jet. Positively charged electrons for events with two jets are shown. The top panel shows the stacked distributions of signal and background processes and the observed data. A shaded band represents the post-fit uncertainty. The middle panel shows the ratio of the post-fit to pre-fit distributions for the signal and background sum. The bottom panel shows the data to signal plus background expectations, prior and after the fit. The error bar in the points is the statistics in data. A shaded band represents the relative postfit and prefit uncertainties. |
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Additional Figure 4-g:
Comparison of the post-fit distributions with the data for electron events with no b-tagged jet. Positively charged electrons for events with three jets are shown. The top panel shows the stacked distributions of signal and background processes and the observed data. A shaded band represents the post-fit uncertainty. The middle panel shows the ratio of the post-fit to pre-fit distributions for the signal and background sum. The bottom panel shows the data to signal plus background expectations, prior and after the fit. The error bar in the points is the statistics in data. A shaded band represents the relative postfit and prefit uncertainties. |
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Additional Figure 4-h:
Comparison of the post-fit distributions with the data for electron events with no b-tagged jet. Positively charged electrons for events with at least four jets are shown. The top panel shows the stacked distributions of signal and background processes and the observed data. A shaded band represents the post-fit uncertainty. The middle panel shows the ratio of the post-fit to pre-fit distributions for the signal and background sum. The bottom panel shows the data to signal plus background expectations, prior and after the fit. The error bar in the points is the statistics in data. A shaded band represents the relative postfit and prefit uncertainties. |
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Additional Figure 5:
Comparison of the post-fit distributions with the data for muon events with no b-tagged jet. Negatively (positively) charged muons are shown on the top (bottom) row. From left to right events with one, two, three or at least four jets are shown. The top panels show the stacked distributions of signal and background processes and the observed data. A shaded band represents the post-fit uncertainty. The middle panels show the ratio of the post-fit to pre-fit distributions for the signal and background sum. The bottom panel shows the data to signal plus background expectations, prior and after the fit. The error bar in the points is the statistics in data. A shaded band represents the relative postfit and prefit uncertainties. |
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Additional Figure 5-a:
Comparison of the post-fit distributions with the data for muon events with no b-tagged jet. Events with a negatively charged muon and one jet are shown. The top panel shows the stacked distributions of signal and background processes and the observed data. A shaded band represents the post-fit uncertainty. The middle panel shows the ratio of the post-fit to pre-fit distributions for the signal and background sum. The bottom panel shows the data to signal plus background expectations, prior and after the fit. The error bar in the points is the statistics in data. A shaded band represents the relative postfit and prefit uncertainties. |
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Additional Figure 5-b:
Comparison of the post-fit distributions with the data for muon events with no b-tagged jet. Events with a negatively charged muon and two jets are shown. The top panel shows the stacked distributions of signal and background processes and the observed data. A shaded band represents the post-fit uncertainty. The middle panel shows the ratio of the post-fit to pre-fit distributions for the signal and background sum. The bottom panel shows the data to signal plus background expectations, prior and after the fit. The error bar in the points is the statistics in data. A shaded band represents the relative postfit and prefit uncertainties. |
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Additional Figure 5-c:
Comparison of the post-fit distributions with the data for muon events with no b-tagged jet. Events with a negatively charged muon and three jets are shown. The top panel shows the stacked distributions of signal and background processes and the observed data. A shaded band represents the post-fit uncertainty. The middle panel shows the ratio of the post-fit to pre-fit distributions for the signal and background sum. The bottom panel shows the data to signal plus background expectations, prior and after the fit. The error bar in the points is the statistics in data. A shaded band represents the relative postfit and prefit uncertainties. |
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Additional Figure 5-d:
Comparison of the post-fit distributions with the data for muon events with no b-tagged jet. Events with a negatively charged muon and at least four jets are shown. The top panel shows the stacked distributions of signal and background processes and the observed data. A shaded band represents the post-fit uncertainty. The middle panel shows the ratio of the post-fit to pre-fit distributions for the signal and background sum. The bottom panel shows the data to signal plus background expectations, prior and after the fit. The error bar in the points is the statistics in data. A shaded band represents the relative postfit and prefit uncertainties. |
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Additional Figure 5-e:
Comparison of the post-fit distributions with the data for muon events with no b-tagged jet. Positively charged muons for events with one jet are shown. The top panel shows the stacked distributions of signal and background processes and the observed data. A shaded band represents the post-fit uncertainty. The middle panel shows the ratio of the post-fit to pre-fit distributions for the signal and background sum. The bottom panel shows the data to signal plus background expectations, prior and after the fit. The error bar in the points is the statistics in data. A shaded band represents the relative postfit and prefit uncertainties. |
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Additional Figure 5-f:
Comparison of the post-fit distributions with the data for muon events with no b-tagged jet. Positively charged muons for events with two jets are shown. The top panel shows the stacked distributions of signal and background processes and the observed data. A shaded band represents the post-fit uncertainty. The middle panel shows the ratio of the post-fit to pre-fit distributions for the signal and background sum. The bottom panel shows the data to signal plus background expectations, prior and after the fit. The error bar in the points is the statistics in data. A shaded band represents the relative postfit and prefit uncertainties. |
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Additional Figure 5-g:
Comparison of the post-fit distributions with the data for muon events with no b-tagged jet. Positively charged muons for events with three jets are shown. The top panel shows the stacked distributions of signal and background processes and the observed data. A shaded band represents the post-fit uncertainty. The middle panel shows the ratio of the post-fit to pre-fit distributions for the signal and background sum. The bottom panel shows the data to signal plus background expectations, prior and after the fit. The error bar in the points is the statistics in data. A shaded band represents the relative postfit and prefit uncertainties. |
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Additional Figure 5-h:
Comparison of the post-fit distributions with the data for muon events with no b-tagged jet. Positively charged muons for events with at least four jets are shown. The top panel shows the stacked distributions of signal and background processes and the observed data. A shaded band represents the post-fit uncertainty. The middle panel shows the ratio of the post-fit to pre-fit distributions for the signal and background sum. The bottom panel shows the data to signal plus background expectations, prior and after the fit. The error bar in the points is the statistics in data. A shaded band represents the relative postfit and prefit uncertainties. |
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Additional Figure 6:
Comparison of the post-fit distributions with the data for electron events with one b-tagged jet. Negatively (positively) charged electrons are shown on the top (bottom) row. From left to right events with one, two, three or at least four jets are shown. The top panels show the stacked distributions of signal and background processes and the observed data. A shaded band represents the post-fit uncertainty. The middle panels show the ratio of the post-fit to pre-fit distributions for the signal and background sum. The bottom panel shows the data to signal plus background expectations, prior and after the fit. The error bar in the points is the statistics in data. A shaded band represents the relative postfit and prefit uncertainties. |
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Additional Figure 6-a:
Comparison of the post-fit distributions with the data for electron events with one b-tagged jet. Events with a negatively charged electron and one jet are shown. The top panel shows the stacked distributions of signal and background processes and the observed data. A shaded band represents the post-fit uncertainty. The middle panel shows the ratio of the post-fit to pre-fit distributions for the signal and background sum. The bottom panel shows the data to signal plus background expectations, prior and after the fit. The error bar in the points is the statistics in data. A shaded band represents the relative postfit and prefit uncertainties. |
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Additional Figure 6-b:
Comparison of the post-fit distributions with the data for electron events with one b-tagged jet. Events with a negatively charged electron and two jets are shown. The top panel shows the stacked distributions of signal and background processes and the observed data. A shaded band represents the post-fit uncertainty. The middle panel shows the ratio of the post-fit to pre-fit distributions for the signal and background sum. The bottom panel shows the data to signal plus background expectations, prior and after the fit. The error bar in the points is the statistics in data. A shaded band represents the relative postfit and prefit uncertainties. |
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Additional Figure 6-c:
Comparison of the post-fit distributions with the data for electron events with one b-tagged jet. Events with a negatively charged electron and three jets are shown. The top panel shows the stacked distributions of signal and background processes and the observed data. A shaded band represents the post-fit uncertainty. The middle panel shows the ratio of the post-fit to pre-fit distributions for the signal and background sum. The bottom panel shows the data to signal plus background expectations, prior and after the fit. The error bar in the points is the statistics in data. A shaded band represents the relative postfit and prefit uncertainties. |
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Additional Figure 6-d:
Comparison of the post-fit distributions with the data for electron events with one b-tagged jet. Events with a negatively charged electron and at least four jets are shown. The top panel shows the stacked distributions of signal and background processes and the observed data. A shaded band represents the post-fit uncertainty. The middle panel shows the ratio of the post-fit to pre-fit distributions for the signal and background sum. The bottom panel shows the data to signal plus background expectations, prior and after the fit. The error bar in the points is the statistics in data. A shaded band represents the relative postfit and prefit uncertainties. |
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Additional Figure 6-e:
Comparison of the post-fit distributions with the data for electron events with one b-tagged jet. Positively charged electrons for events with one jet are shown. The top panel shows the stacked distributions of signal and background processes and the observed data. A shaded band represents the post-fit uncertainty. The middle panel shows the ratio of the post-fit to pre-fit distributions for the signal and background sum. The bottom panel shows the data to signal plus background expectations, prior and after the fit. The error bar in the points is the statistics in data. A shaded band represents the relative postfit and prefit uncertainties. |
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Additional Figure 6-f:
Comparison of the post-fit distributions with the data for electron events with one b-tagged jet. Positively charged electrons for events with two jets are shown. The top panel shows the stacked distributions of signal and background processes and the observed data. A shaded band represents the post-fit uncertainty. The middle panel shows the ratio of the post-fit to pre-fit distributions for the signal and background sum. The bottom panel shows the data to signal plus background expectations, prior and after the fit. The error bar in the points is the statistics in data. A shaded band represents the relative postfit and prefit uncertainties. |
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Additional Figure 6-g:
Comparison of the post-fit distributions with the data for electron events with one b-tagged jet. Positively charged electrons for events with three jets are shown. The top panel shows the stacked distributions of signal and background processes and the observed data. A shaded band represents the post-fit uncertainty. The middle panel shows the ratio of the post-fit to pre-fit distributions for the signal and background sum. The bottom panel shows the data to signal plus background expectations, prior and after the fit. The error bar in the points is the statistics in data. A shaded band represents the relative postfit and prefit uncertainties. |
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Additional Figure 6-h:
Comparison of the post-fit distributions with the data for electron events with one b-tagged jet. Positively charged electrons for events with at least four jets are shown. The top panel shows the stacked distributions of signal and background processes and the observed data. A shaded band represents the post-fit uncertainty. The middle panel shows the ratio of the post-fit to pre-fit distributions for the signal and background sum. The bottom panel shows the data to signal plus background expectations, prior and after the fit. The error bar in the points is the statistics in data. A shaded band represents the relative postfit and prefit uncertainties. |
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Additional Figure 7:
Comparison of the post-fit distributions with the data for muon events with one b-tagged jet. Negatively (positively) charged muons are shown on the top (bottom) row. From left to right events with one, two, three or at least four jets are shown. The top panels show the stacked distributions of signal and background processes and the observed data. A shaded band represents the post-fit uncertainty. The middle panels show the ratio of the post-fit to pre-fit distributions for the signal and background sum. The bottom panel shows the data to signal plus background expectations, prior and after the fit. The error bar in the points is the statistics in data. A shaded band represents the relative postfit and prefit uncertainties. |
png pdf |
Additional Figure 7-a:
Comparison of the post-fit distributions with the data for muon events with one b-tagged jet. Events with a negatively charged muon and one jet are shown. The top panel shows the stacked distributions of signal and background processes and the observed data. A shaded band represents the post-fit uncertainty. The middle panel shows the ratio of the post-fit to pre-fit distributions for the signal and background sum. The bottom panel shows the data to signal plus background expectations, prior and after the fit. The error bar in the points is the statistics in data. A shaded band represents the relative postfit and prefit uncertainties. |
png pdf |
Additional Figure 7-b:
Comparison of the post-fit distributions with the data for muon events with one b-tagged jet. Events with a negatively charged muon and two jets are shown. The top panel shows the stacked distributions of signal and background processes and the observed data. A shaded band represents the post-fit uncertainty. The middle panel shows the ratio of the post-fit to pre-fit distributions for the signal and background sum. The bottom panel shows the data to signal plus background expectations, prior and after the fit. The error bar in the points is the statistics in data. A shaded band represents the relative postfit and prefit uncertainties. |
png pdf |
Additional Figure 7-c:
Comparison of the post-fit distributions with the data for muon events with one b-tagged jet. Events with a negatively charged muon and three jets are shown. The top panel shows the stacked distributions of signal and background processes and the observed data. A shaded band represents the post-fit uncertainty. The middle panel shows the ratio of the post-fit to pre-fit distributions for the signal and background sum. The bottom panel shows the data to signal plus background expectations, prior and after the fit. The error bar in the points is the statistics in data. A shaded band represents the relative postfit and prefit uncertainties. |
png pdf |
Additional Figure 7-d:
Comparison of the post-fit distributions with the data for muon events with one b-tagged jet. Events with a negatively charged muon and at least four jets are shown. The top panel shows the stacked distributions of signal and background processes and the observed data. A shaded band represents the post-fit uncertainty. The middle panel shows the ratio of the post-fit to pre-fit distributions for the signal and background sum. The bottom panel shows the data to signal plus background expectations, prior and after the fit. The error bar in the points is the statistics in data. A shaded band represents the relative postfit and prefit uncertainties. |
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Additional Figure 7-e:
Comparison of the post-fit distributions with the data for muon events with one b-tagged jet. Positively charged muons for events with one jet are shown. The top panel shows the stacked distributions of signal and background processes and the observed data. A shaded band represents the post-fit uncertainty. The middle panel shows the ratio of the post-fit to pre-fit distributions for the signal and background sum. The bottom panel shows the data to signal plus background expectations, prior and after the fit. The error bar in the points is the statistics in data. A shaded band represents the relative postfit and prefit uncertainties. |
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Additional Figure 7-f:
Comparison of the post-fit distributions with the data for muon events with one b-tagged jet. Positively charged muons for events with two jets are shown. The top panel shows the stacked distributions of signal and background processes and the observed data. A shaded band represents the post-fit uncertainty. The middle panel shows the ratio of the post-fit to pre-fit distributions for the signal and background sum. The bottom panel shows the data to signal plus background expectations, prior and after the fit. The error bar in the points is the statistics in data. A shaded band represents the relative postfit and prefit uncertainties. |
png pdf |
Additional Figure 7-g:
Comparison of the post-fit distributions with the data for muon events with one b-tagged jet. Positively charged muons for events with three jets are shown. The top panel shows the stacked distributions of signal and background processes and the observed data. A shaded band represents the post-fit uncertainty. The middle panel shows the ratio of the post-fit to pre-fit distributions for the signal and background sum. The bottom panel shows the data to signal plus background expectations, prior and after the fit. The error bar in the points is the statistics in data. A shaded band represents the relative postfit and prefit uncertainties. |
png pdf |
Additional Figure 7-h:
Comparison of the post-fit distributions with the data for muon events with one b-tagged jet. Positively charged muons for events with at least four jets are shown. The top panel shows the stacked distributions of signal and background processes and the observed data. A shaded band represents the post-fit uncertainty. The middle panel shows the ratio of the post-fit to pre-fit distributions for the signal and background sum. The bottom panel shows the data to signal plus background expectations, prior and after the fit. The error bar in the points is the statistics in data. A shaded band represents the relative postfit and prefit uncertainties. |
png pdf |
Additional Figure 8:
Comparison of the post-fit distributions with the data for electron events with at least two b-tagged jets. Negatively (positively) charged electrons are shown on the top (bottom) row. From left to right events with two, three or at least four jets are shown. The top panels show the stacked distributions of signal and background processes and the observed data. A shaded band represents the post-fit uncertainty. The middle panels show the ratio of the post-fit to pre-fit distributions for the signal and background sum. The bottom panel shows the data to signal plus background expectations, prior and after the fit. The error bar in the points is the statistics in data. A shaded band represents the relative postfit and prefit uncertainties. |
png pdf |
Additional Figure 8-a:
Comparison of the post-fit distributions with the data for electron events with at least two b-tagged jets. Events with a negatively charged electron and two jets are shown. The top panel shows the stacked distributions of signal and background processes and the observed data. A shaded band represents the post-fit uncertainty. The middle panel shows the ratio of the post-fit to pre-fit distributions for the signal and background sum. The bottom panel shows the data to signal plus background expectations, prior and after the fit. The error bar in the points is the statistics in data. A shaded band represents the relative postfit and prefit uncertainties. |
png pdf |
Additional Figure 8-b:
Comparison of the post-fit distributions with the data for electron events with at least two b-tagged jets. Events with a negatively charged electron and three jets are shown. The top panel shows the stacked distributions of signal and background processes and the observed data. A shaded band represents the post-fit uncertainty. The middle panel shows the ratio of the post-fit to pre-fit distributions for the signal and background sum. The bottom panel shows the data to signal plus background expectations, prior and after the fit. The error bar in the points is the statistics in data. A shaded band represents the relative postfit and prefit uncertainties. |
png pdf |
Additional Figure 8-c:
Comparison of the post-fit distributions with the data for electron events with at least two b-tagged jets. Events with a negatively charged electron and at least four jets are shown. The top panel shows the stacked distributions of signal and background processes and the observed data. A shaded band represents the post-fit uncertainty. The middle panel shows the ratio of the post-fit to pre-fit distributions for the signal and background sum. The bottom panel shows the data to signal plus background expectations, prior and after the fit. The error bar in the points is the statistics in data. A shaded band represents the relative postfit and prefit uncertainties. |
png pdf |
Additional Figure 8-d:
Comparison of the post-fit distributions with the data for electron events with at least two b-tagged jets. Positively charged electrons for events with two jets are shown. The top panel shows the stacked distributions of signal and background processes and the observed data. A shaded band represents the post-fit uncertainty. The middle panel shows the ratio of the post-fit to pre-fit distributions for the signal and background sum. The bottom panel shows the data to signal plus background expectations, prior and after the fit. The error bar in the points is the statistics in data. A shaded band represents the relative postfit and prefit uncertainties. |
png pdf |
Additional Figure 8-e:
Comparison of the post-fit distributions with the data for electron events with at least two b-tagged jets. Positively charged electrons for events with three jets are shown. The top panel shows the stacked distributions of signal and background processes and the observed data. A shaded band represents the post-fit uncertainty. The middle panel shows the ratio of the post-fit to pre-fit distributions for the signal and background sum. The bottom panel shows the data to signal plus background expectations, prior and after the fit. The error bar in the points is the statistics in data. A shaded band represents the relative postfit and prefit uncertainties. |
png pdf |
Additional Figure 8-f:
Comparison of the post-fit distributions with the data for electron events with at least two b-tagged jets. Positively charged electrons for events with at least four jets are shown. The top panel shows the stacked distributions of signal and background processes and the observed data. A shaded band represents the post-fit uncertainty. The middle panel shows the ratio of the post-fit to pre-fit distributions for the signal and background sum. The bottom panel shows the data to signal plus background expectations, prior and after the fit. The error bar in the points is the statistics in data. A shaded band represents the relative postfit and prefit uncertainties. |
png pdf |
Additional Figure 9:
Comparison of the post-fit distributions with the data for muon events with at least two b-tagged jets. Negatively (positively) charged muons are shown on the top (bottom) row. From left to right events with two, three or at least four jets are shown. The top panels show the stacked distributions of signal and background processes and the observed data. A shaded band represents the post-fit uncertainty. The middle panels show the ratio of the post-fit to pre-fit distributions for the signal and background sum. The bottom panel shows the data to signal plus background expectations, prior and after the fit. The error bar in the points is the statistics in data. A shaded band represents the relative postfit and prefit uncertainties. |
png pdf |
Additional Figure 9-a:
Comparison of the post-fit distributions with the data for muon events with at least two b-tagged jets. Events with a negatively charged muon and two jets are shown. The top panel shows the stacked distributions of signal and background processes and the observed data. A shaded band represents the post-fit uncertainty. The middle panel shows the ratio of the post-fit to pre-fit distributions for the signal and background sum. The bottom panel shows the data to signal plus background expectations, prior and after the fit. The error bar in the points is the statistics in data. A shaded band represents the relative postfit and prefit uncertainties. |
png pdf |
Additional Figure 9-b:
Comparison of the post-fit distributions with the data for muon events with at least two b-tagged jets. Events with a negatively charged muon and three jets are shown. The top panel shows the stacked distributions of signal and background processes and the observed data. A shaded band represents the post-fit uncertainty. The middle panel shows the ratio of the post-fit to pre-fit distributions for the signal and background sum. The bottom panel shows the data to signal plus background expectations, prior and after the fit. The error bar in the points is the statistics in data. A shaded band represents the relative postfit and prefit uncertainties. |
png pdf |
Additional Figure 9-c:
Comparison of the post-fit distributions with the data for muon events with at least two b-tagged jets. Events with a negatively charged muon and at least four jets are shown. The top panel shows the stacked distributions of signal and background processes and the observed data. A shaded band represents the post-fit uncertainty. The middle panel shows the ratio of the post-fit to pre-fit distributions for the signal and background sum. The bottom panel shows the data to signal plus background expectations, prior and after the fit. The error bar in the points is the statistics in data. A shaded band represents the relative postfit and prefit uncertainties. |
png pdf |
Additional Figure 9-d:
Comparison of the post-fit distributions with the data for muon events with at least two b-tagged jets. Positively charged muons for events with two jets are shown. The top panel shows the stacked distributions of signal and background processes and the observed data. A shaded band represents the post-fit uncertainty. The middle panel shows the ratio of the post-fit to pre-fit distributions for the signal and background sum. The bottom panel shows the data to signal plus background expectations, prior and after the fit. The error bar in the points is the statistics in data. A shaded band represents the relative postfit and prefit uncertainties. |
png pdf |
Additional Figure 9-e:
Comparison of the post-fit distributions with the data for muon events with at least two b-tagged jets. Positively charged muons for events with three jets are shown. The top panel shows the stacked distributions of signal and background processes and the observed data. A shaded band represents the post-fit uncertainty. The middle panel shows the ratio of the post-fit to pre-fit distributions for the signal and background sum. The bottom panel shows the data to signal plus background expectations, prior and after the fit. The error bar in the points is the statistics in data. A shaded band represents the relative postfit and prefit uncertainties. |
png pdf |
Additional Figure 9-f:
Comparison of the post-fit distributions with the data for muon events with at least two b-tagged jets. Positively charged muons for events with at least four jets are shown. The top panel shows the stacked distributions of signal and background processes and the observed data. A shaded band represents the post-fit uncertainty. The middle panel shows the ratio of the post-fit to pre-fit distributions for the signal and background sum. The bottom panel shows the data to signal plus background expectations, prior and after the fit. The error bar in the points is the statistics in data. A shaded band represents the relative postfit and prefit uncertainties. |
png pdf |
Additional Figure 10:
The dependence of the likelihood on the top quark pole mass is shown for the count analysis and the analysis of distributions, using the CT14nnlo PDF set. The expected dependence from the simulation, using the a priori set of nuisance parameters with their expected values at $m_\mathrm{ t } = $ 172.5 GeV, is also shown for comparison. The changes in the likelihood corresponding to the 68% and 95% confidence levels are shown by the dashed lines. |
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