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| CMS-SMP-21-002 ; CERN-EP-2022-013 | ||
| Measurement of the Drell-Yan forward-backward asymmetry at high dilepton masses in proton-proton collisions at $\sqrt{s} = $ 13 TeV | ||
| CMS Collaboration | ||
| 24 February 2022 | ||
| JHEP 08 (2022) 063 | ||
| Abstract: A measurement of the forward-backward asymmetry of pairs of oppositely charged leptons (dimuons and dielectrons) produced by the Drell-Yan process in proton-proton collisions is presented. The data sample corresponds to an integrated luminosity of 138 fb$^{-1}$ collected with the CMS detector at the LHC at a center-of-mass energy of 13 TeV. The asymmetry is measured as a function of lepton pair mass for masses larger than 170 GeV and compared with standard model predictions. An inclusive measurement across both channels and the full mass range yields an asymmetry of 0.599 $\pm$ 0.005 (stat) $\pm$ 0.007 (syst). As a test of lepton flavor universality, the difference between the dimuon and dielectron asymmetries is measured as well. No statistically significant deviations from standard model predictions are observed. The measurements are used to set limits on the presence of additional gauge bosons. For a Z' in the sequential standard model, a lower mass limit of 4.4 TeV is set at 95% confidence level. | ||
| Links: e-print arXiv:2202.12327 [hep-ex] (PDF) ; CDS record ; inSPIRE record ; HepData record ; CADI line (restricted) ; | ||
| Figures | |
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Figure 1:
The invariant mass distribution (left) and ${\cos\theta _\mathrm {R}}$ distribution (right) of e$\mu$ events observed in CMS data (black dots with statistical uncertainties) and expected backgrounds (stacked histograms). The hatched bands show the systematic uncertainty in the expected yield. The sources of this uncertainty are discussed in Section 8. The lower panels show the ratio of the data to the expectations. The gray bands represent the total uncertainty in the predicted yields. |
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Figure 1-a:
The invariant mass distribution of e$\mu$ events observed in CMS data (black dots with statistical uncertainties) and expected backgrounds (stacked histograms). The hatched bands show the systematic uncertainty in the expected yield. The sources of this uncertainty are discussed in Section 8. The lower panel shows the ratio of the data to the expectations. The gray bands represent the total uncertainty in the predicted yields. |
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Figure 1-b:
The ${\cos\theta _\mathrm {R}}$ distribution of e$\mu$ events observed in CMS data (black dots with statistical uncertainties) and expected backgrounds (stacked histograms). The hatched bands show the systematic uncertainty in the expected yield. The sources of this uncertainty are discussed in Section 8. The lower panel shows the ratio of the data to the expectations. The gray bands represent the total uncertainty in the predicted yields. |
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Figure 2:
A comparison of CMS data and expected signal and background distributions in dilepton invariant mass (upper row), ${\cos\theta _\mathrm {R}}$ (middle row) and dilepton rapidity (lower row). The left plot shows the $ {{\mu}} {{\mu}}$ channel and the right plot the ee channel. The black points with error bars represent the data and their statistical uncertainties, whereas the combined signal and background expectation is shown as stacked histograms. The hatched band shows the systematic uncertainty in the expected signal and background yield. The sources of this uncertainty are discussed in Section 8. The lower panels show the ratio of the data to the expectation. The gray bands represents the total uncertainty in the predicted yield. |
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Figure 2-a:
A comparison of CMS data and expected signal and background dilepton invariant mass distributions. The plot shows the $ {{\mu}} {{\mu}}$ channel. The black points with error bars represent the data and their statistical uncertainties, whereas the combined signal and background expectation is shown as stacked histograms. The hatched band shows the systematic uncertainty in the expected signal and background yield. The sources of this uncertainty are discussed in Section 8. The lower panel shows the ratio of the data to the expectation. The gray bands represents the total uncertainty in the predicted yield. |
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Figure 2-b:
A comparison of CMS data and expected signal and background ${\cos\theta _\mathrm {R}}$ dilepton rapidity distributions. The plot shows the ee channel. The black points with error bars represent the data and their statistical uncertainties, whereas the combined signal and background expectation is shown as stacked histograms. The hatched band shows the systematic uncertainty in the expected signal and background yield. The sources of this uncertainty are discussed in Section 8. The lower panel shows the ratio of the data to the expectation. The gray bands represents the total uncertainty in the predicted yield. |
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Figure 2-c:
A comparison of CMS data and expected signal and background ${\cos\theta _\mathrm {R}}$ distributions. The plot shows the $ {{\mu}} {{\mu}}$ channel. The black points with error bars represent the data and their statistical uncertainties, whereas the combined signal and background expectation is shown as stacked histograms. The hatched band shows the systematic uncertainty in the expected signal and background yield. The sources of this uncertainty are discussed in Section 8. The lower panel shows the ratio of the data to the expectation. The gray bands represents the total uncertainty in the predicted yield. |
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Figure 2-d:
A comparison of CMS data and expected signal and background ${\cos\theta _\mathrm {R}}$ distributions. The plot shows the ee channel. The black points with error bars represent the data and their statistical uncertainties, whereas the combined signal and background expectation is shown as stacked histograms. The hatched band shows the systematic uncertainty in the expected signal and background yield. The sources of this uncertainty are discussed in Section 8. The lower panel shows the ratio of the data to the expectation. The gray bands represents the total uncertainty in the predicted yield. |
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Figure 2-e:
A comparison of CMS data and expected signal and background dilepton rapidity distributions. The plot shows the $ {{\mu}} {{\mu}}$ channel. The black points with error bars represent the data and their statistical uncertainties, whereas the combined signal and background expectation is shown as stacked histograms. The hatched band shows the systematic uncertainty in the expected signal and background yield. The sources of this uncertainty are discussed in Section 8. The lower panel shows the ratio of the data to the expectation. The gray bands represents the total uncertainty in the predicted yield. |
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Figure 2-f:
A comparison of CMS data and expected signal and background dilepton rapidity distributions. The plot shows the ee channel. The black points with error bars represent the data and their statistical uncertainties, whereas the combined signal and background expectation is shown as stacked histograms. The hatched band shows the systematic uncertainty in the expected signal and background yield. The sources of this uncertainty are discussed in Section 8. The lower panel shows the ratio of the data to the expectation. The gray bands represents the total uncertainty in the predicted yield. |
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Figure 3:
Measurement of the DY forward-backward asymmetry as a function the dilepton mass compared with the MC predictions. The green line is the predicted value for ${A_\text {FB}}$ from the aMC@NLO simulation and the shaded green region its uncertainty. The blue, red, and black points and error bars represent the dimuon, dielectron, and combined measurements, respectively. Error bars on the measurements include both statistical and systematic components. The bottom panel shows the ratio between the combined measurement and the aMC@NLO prediction. In the bottom panel, the vertical error bars represent the uncertainty in the combined measurement and the shaded green band the uncertainty in the aMC@NLO prediction. |
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Figure 4:
Measurement of the DY forward-backward asymmetry as a function the dilepton mass compared with the MC predictions. The green line is the predicted value for ${A_\text {FB}}$ from the aMC@NLO simulation and the shaded green region its uncertainty. The blue, red, and black points and error bars represent the dimuon, dielectron, and combined measurements, respectively. Error bars on the measurements include both statistical and systematic components. |
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Figure 5:
Measurement of the difference in forward-backward asymmetry between the dimuon and dielectron channels. The green line is drawn at zero, the predicted value for $\Delta {A_\text {FB}} $ assuming lepton flavor universality. The black points and error bars represent the measurements of $\Delta {A_\text {FB}} $ in different mass bins. The blue line and shaded light blue region represent the inclusive measurement of $\Delta {A_\text {FB}} $ and corresponding uncertainty. The error bars on the measurements and the shaded region include both statistical and systematic components. |
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Figure 6:
Exclusion limits at 95% CL on the coupling parameter $\kappa _\mathrm {L}$ for a Z' in the sequential standard model as a function of the Z' mass. The expected (observed) limit is shown by the dashed (solid) line. The inner and outer shaded areas around the expected limits show the 68% (green) and 95% (yellow) CL intervals, respectively. The dashed blue line shows $\kappa _{L} = $ 1 which corresponds to a Z' with exactly the same couplings as the SM Z boson. |
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Figure 7:
The postfit distributions in the 170-200, 200-250 and 250-320 GeV mass bins are shown in upper, middle and lower rows, respectively. The left column is the $ {{\mu}} {{\mu}}$ channel, and the right column the ee channel. The contribution of the $ {\tau} {\tau} $ background is not visible on the scale of these plots and has been omitted. The 2D templates follow the ${\cos\theta _\mathrm {R}}$ and $ {| y |}$ binning defined in Section 7 but are presented here in one dimension, with the the dotted lines indicating the different $ {| y |}$ bins. The black points and error bars represent the data and their statistical uncertainties. The bottom panel in each figure shows the ratio between the number of events observed in data and the best fit value. The gray shaded region in the bottom panel shows the total uncertainty in the best fit result. |
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Figure 7-a:
The postfit distributions in the 170-200 GeV mass bin, in the $ {{\mu}} {{\mu}}$ channel. The contribution of the $ {\tau} {\tau} $ background is not visible on the scale of these plots and has been omitted. The 2D templates follow the ${\cos\theta _\mathrm {R}}$ and $ {| y |}$ binning defined in Section 7 but are presented here in one dimension, with the the dotted lines indicating the different $ {| y |}$ bins. The black points and error bars represent the data and their statistical uncertainties. The bottom panel shows the ratio between the number of events observed in data and the best fit value. The gray shaded region in the bottom panel shows the total uncertainty in the best fit result. |
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Figure 7-b:
The postfit distributions in the 170-200 GeV mass bin, in the ee channel. The contribution of the $ {\tau} {\tau} $ background is not visible on the scale of these plots and has been omitted. The 2D templates follow the ${\cos\theta _\mathrm {R}}$ and $ {| y |}$ binning defined in Section 7 but are presented here in one dimension, with the the dotted lines indicating the different $ {| y |}$ bins. The black points and error bars represent the data and their statistical uncertainties. The bottom panel shows the ratio between the number of events observed in data and the best fit value. The gray shaded region in the bottom panel shows the total uncertainty in the best fit result. |
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Figure 7-c:
The postfit distributions in the 200-250 GeV mass bin, in the $ {{\mu}} {{\mu}}$ channel. The contribution of the $ {\tau} {\tau} $ background is not visible on the scale of these plots and has been omitted. The 2D templates follow the ${\cos\theta _\mathrm {R}}$ and $ {| y |}$ binning defined in Section 7 but are presented here in one dimension, with the the dotted lines indicating the different $ {| y |}$ bins. The black points and error bars represent the data and their statistical uncertainties. The bottom panel shows the ratio between the number of events observed in data and the best fit value. The gray shaded region in the bottom panel shows the total uncertainty in the best fit result. |
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Figure 7-d:
The postfit distributions in the 200-250 GeV mass bin, in the ee channel. The contribution of the $ {\tau} {\tau} $ background is not visible on the scale of these plots and has been omitted. The 2D templates follow the ${\cos\theta _\mathrm {R}}$ and $ {| y |}$ binning defined in Section 7 but are presented here in one dimension, with the the dotted lines indicating the different $ {| y |}$ bins. The black points and error bars represent the data and their statistical uncertainties. The bottom panel shows the ratio between the number of events observed in data and the best fit value. The gray shaded region in the bottom panel shows the total uncertainty in the best fit result. |
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Figure 7-e:
The postfit distributions in the 250-320 GeV mass bin, in the $ {{\mu}} {{\mu}}$ channel. The contribution of the $ {\tau} {\tau} $ background is not visible on the scale of these plots and has been omitted. The 2D templates follow the ${\cos\theta _\mathrm {R}}$ and $ {| y |}$ binning defined in Section 7 but are presented here in one dimension, with the the dotted lines indicating the different $ {| y |}$ bins. The black points and error bars represent the data and their statistical uncertainties. The bottom panel shows the ratio between the number of events observed in data and the best fit value. The gray shaded region in the bottom panel shows the total uncertainty in the best fit result. |
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Figure 7-f:
The postfit distributions in the 250-320 GeV mass bin, in the ee channel. The contribution of the $ {\tau} {\tau} $ background is not visible on the scale of these plots and has been omitted. The 2D templates follow the ${\cos\theta _\mathrm {R}}$ and $ {| y |}$ binning defined in Section 7 but are presented here in one dimension, with the the dotted lines indicating the different $ {| y |}$ bins. The black points and error bars represent the data and their statistical uncertainties. The bottom panel shows the ratio between the number of events observed in data and the best fit value. The gray shaded region in the bottom panel shows the total uncertainty in the best fit result. |
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Figure 8:
The postfit distributions in the 320-510 and 510-700 GeV mass bins are shown in the upper and lower rows, respectively. The left column is the $ {{\mu}} {{\mu}}$ channel, and the right column the ee channel. The contribution of the $ {\tau} {\tau} $ background is not visible on the scale of these plots and has been omitted. The 2D templates follow the ${\cos\theta _\mathrm {R}}$ and $ {| y |}$ binning defined in Section 7 but are presented here in one dimension, with the the dotted lines indicating the different $ {| y |}$ bins. The black points and error bars represent the data and their statistical uncertainties. The bottom panel in each figure shows the ratio between the number of events observed in data and the best fit value. The gray shaded region in the bottom panel shows the total uncertainty in the best fit result. |
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Figure 8-a:
The postfit distributions in the 320-510 GeV mass bin, in the $ {{\mu}} {{\mu}}$ channel. The contribution of the $ {\tau} {\tau} $ background is not visible on the scale of these plots and has been omitted. The 2D templates follow the ${\cos\theta _\mathrm {R}}$ and $ {| y |}$ binning defined in Section 7 but are presented here in one dimension, with the the dotted lines indicating the different $ {| y |}$ bins. The black points and error bars represent the data and their statistical uncertainties. The bottom panel shows the ratio between the number of events observed in data and the best fit value. The gray shaded region in the bottom panel shows the total uncertainty in the best fit result. |
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Figure 8-b:
The postfit distributions in the 320-510 GeV mass bin, in the ee channel. The contribution of the $ {\tau} {\tau} $ background is not visible on the scale of these plots and has been omitted. The 2D templates follow the ${\cos\theta _\mathrm {R}}$ and $ {| y |}$ binning defined in Section 7 but are presented here in one dimension, with the the dotted lines indicating the different $ {| y |}$ bins. The black points and error bars represent the data and their statistical uncertainties. The bottom panel shows the ratio between the number of events observed in data and the best fit value. The gray shaded region in the bottom panel shows the total uncertainty in the best fit result. |
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Figure 8-c:
The postfit distributions in the 510-700 GeV mass bin, in the $ {{\mu}} {{\mu}}$ channel. The contribution of the $ {\tau} {\tau} $ background is not visible on the scale of these plots and has been omitted. The 2D templates follow the ${\cos\theta _\mathrm {R}}$ and $ {| y |}$ binning defined in Section 7 but are presented here in one dimension, with the the dotted lines indicating the different $ {| y |}$ bins. The black points and error bars represent the data and their statistical uncertainties. The bottom panel shows the ratio between the number of events observed in data and the best fit value. The gray shaded region in the bottom panel shows the total uncertainty in the best fit result. |
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Figure 8-d:
The postfit distributions in the 510-700 GeV mass bin, in the ee channel. The contribution of the $ {\tau} {\tau} $ background is not visible on the scale of these plots and has been omitted. The 2D templates follow the ${\cos\theta _\mathrm {R}}$ and $ {| y |}$ binning defined in Section 7 but are presented here in one dimension, with the the dotted lines indicating the different $ {| y |}$ bins. The black points and error bars represent the data and their statistical uncertainties. The bottom panel shows the ratio between the number of events observed in data and the best fit value. The gray shaded region in the bottom panel shows the total uncertainty in the best fit result. |
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Figure 9:
The postfit distributions in the 700-1000 and $ > $1000 GeV mass bins are shown in the upper and lower rows, respectively. The left plot is the $ {{\mu}} {{\mu}}$ channel, and the right plot the ee channel. The contribution of the $ {\tau} {\tau} $ background is not visible on the scale of these plots and has been omitted. The 2D templates follow the ${\cos\theta _\mathrm {R}}$ and $ {| y |}$ binning defined in Section 7 but are presented here in one dimension, with the the dotted lines indicating the different $ {| y |}$ bins. The black points and error bars represent the data and their statistical uncertainties. The bottom panel in each figure shows the ratio between the number of events observed in data and the best fit value. The gray shaded region in the bottom panel shows the total uncertainty in the best fit result. |
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Figure 9-a:
The postfit distributions in the 700-1000 GeV mass bin, in the $ {{\mu}} {{\mu}}$ channel. The contribution of the $ {\tau} {\tau} $ background is not visible on the scale of these plots and has been omitted. The 2D templates follow the ${\cos\theta _\mathrm {R}}$ and $ {| y |}$ binning defined in Section 7 but are presented here in one dimension, with the the dotted lines indicating the different $ {| y |}$ bins. The black points and error bars represent the data and their statistical uncertainties. The bottom panel shows the ratio between the number of events observed in data and the best fit value. The gray shaded region in the bottom panel shows the total uncertainty in the best fit result. |
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Figure 9-b:
The postfit distributions in the 700-1000 GeV mass bin, in the ee channel. The contribution of the $ {\tau} {\tau} $ background is not visible on the scale of these plots and has been omitted. The 2D templates follow the ${\cos\theta _\mathrm {R}}$ and $ {| y |}$ binning defined in Section 7 but are presented here in one dimension, with the the dotted lines indicating the different $ {| y |}$ bins. The black points and error bars represent the data and their statistical uncertainties. The bottom panel shows the ratio between the number of events observed in data and the best fit value. The gray shaded region in the bottom panel shows the total uncertainty in the best fit result. |
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Figure 9-c:
The postfit distributions in the $ > $1000 GeV mass bin, in the $ {{\mu}} {{\mu}}$ channel. The contribution of the $ {\tau} {\tau} $ background is not visible on the scale of these plots and has been omitted. The 2D templates follow the ${\cos\theta _\mathrm {R}}$ and $ {| y |}$ binning defined in Section 7 but are presented here in one dimension, with the the dotted lines indicating the different $ {| y |}$ bins. The black points and error bars represent the data and their statistical uncertainties. The bottom panel shows the ratio between the number of events observed in data and the best fit value. The gray shaded region in the bottom panel shows the total uncertainty in the best fit result. |
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Figure 9-d:
The postfit distributions in the $ > $1000 GeV mass bin, in the ee channel. The contribution of the $ {\tau} {\tau} $ background is not visible on the scale of these plots and has been omitted. The 2D templates follow the ${\cos\theta _\mathrm {R}}$ and $ {| y |}$ binning defined in Section 7 but are presented here in one dimension, with the the dotted lines indicating the different $ {| y |}$ bins. The black points and error bars represent the data and their statistical uncertainties. The bottom panel shows the ratio between the number of events observed in data and the best fit value. The gray shaded region in the bottom panel shows the total uncertainty in the best fit result. |
| Tables | |
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Table 1:
A comparison of the magnitude of the different sources of systematic uncertainty for the measurement of ${A_\text {FB}}$ when combining the muon and electron channels and for the measurement of $\Delta {A_\text {FB}} $. Results for the 170-200 GeV mass bin are shown because that is the mass bin in which the systematic uncertainty has the largest contribution to the total uncertainty; the results for other mass bins are similar. Results are also reported as a fraction of the overall systematic uncertainty for the measurement of ${A_\text {FB}}$ and $\Delta {A_\text {FB}} $. Sources are listed in order of the size of their contribution to the uncertainty in ${A_\text {FB}}$. |
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Table 2:
Results for the measurement of ${A_\text {FB}}$ from the maximum likelihood fit to data in different dilepton mass bins in the different channels as well as an inclusive measurement across all mass bins. The first and second uncertainties listed with each measurement are statistical and systematic, respectively. |
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Table 3:
Results for the measurement of ${A_{0}}$ from the maximum likelihood fit to data in different dilepton mass bins in the different channels as well as an inclusive measurement across all mass bins. The first and second uncertainties listed with each measurement are statistical and systematic, respectively. To help in the interpretation of these results, we also list the average dilepton $ {p_{\mathrm {T}}} $ of the data events in each mass bin. |
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Table 4:
Results for the measurement of $\Delta {A_\text {FB}} $ and $\Delta {A_{0}} $ between the muon and electron channels from the maximum likelihood fit to data in different dilepton mass bins as well as an inclusive measurement across all mass bins. The first and second uncertainties listed with each measurement are statistical and systematic, respectively. |
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Table 5:
The fraction of photon-induced background as compared with the total amount of DY signal plus photon-induced events ($N_{{\gamma} {\gamma}}/(N_{{\gamma} {\gamma}} + N_\mathrm {DY})$) in different dilepton mass bins. These numbers are averaged across the different years and channels. |
| Summary |
| The CMS detector at the LHC has been used to measure the Drell-Yan forward-backward asymmetry (${A_\text{FB}}$) and the angular coefficient $A_{0}$ as functions of dilepton mass for muon and electron pairs with invariant mass above 170 GeV. The measurement is performed using proton-proton collision data collected in 2016-2018 at $\sqrt{s} = $ 13 TeV with an integrated luminosity of 138 fb$^{-1}$ using a template fitting approach. The combined dimuon and dielectron ${A_\text{FB}}$ measurements show good agreement with the standard model predictions across the full mass range. An inclusive measurement across the full mass range yields an ${A_\text{FB}}$ of 0.599 $\pm$ 0.005 (stat) $\pm$ 0.007 (syst) and an $A_{0}$ of 0.047 $\pm$ 0.005 (stat) $\pm$ 0.013 (syst). As a test of lepton flavor universality, the difference between the dimuon and dielectron ${A_\text{FB}}\mathrm{s}$ is measured and found to agree with zero to within 2.4 standard deviations. Using the combined ${A_\text{FB}}$ measurements, limits are set on the existence of additional gauge bosons. For a Z' boson in the canonical sequential standard model, masses of $m_{\mathrm{Z'}} < $ 4.4 TeV are excluded at 95% confidence level. |
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